Patents by Inventor Hiroyoshi Mori

Hiroyoshi Mori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6452178
    Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.
    Type: Grant
    Filed: June 19, 2001
    Date of Patent: September 17, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio ichihashi, Satoru Fukuhara, Hiroyuki Shinada, Yutaka Kaneko, Katsuya Sugiyama, Atsuko Takafuji, Hiroshi Toyama
  • Publication number: 20020092986
    Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer.
    Type: Application
    Filed: February 27, 2002
    Publication date: July 18, 2002
    Inventors: Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio Ichihashi, Satoru Fukuhara, Hiroyuki Shinada, Yutaka Kaneko, Katsuya Sugiyama, Atsuko Takafuji, Hiroshi Toyama
  • Patent number: 6408890
    Abstract: A hard pipe has an annular stop projection formed about its portion press fitted in a flexible hose to make a hose connecting structure. The projection has a cross sectional contour including a gentle outward slope extending from the front end of the projection to a first corner, which makes the angle of the subsequent second corner gentle, and a rear face at the second corner extending inwardly toward the longitudinal axis of the pipe at right angles thereto. The hose connecting structure has high levels of pull-out strength and sealing properties without having the hose damaged by the projection on the pipe.
    Type: Grant
    Filed: October 18, 2000
    Date of Patent: June 25, 2002
    Assignee: Tokai Rubber Industries, Ltd.
    Inventor: Hiroyoshi Mori
  • Publication number: 20020024021
    Abstract: An object of the present invention is to provide an inspection method using an electron beam and an inspection apparatus therefor, which are capable of enhancing the resolution, improving the inspection speed and reliability, and realizing miniaturization the apparatus.
    Type: Application
    Filed: October 22, 2001
    Publication date: February 28, 2002
    Applicant: Hitachi, Ltd.
    Inventors: Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio Ichihashi, Satoru Fukuhara, Hiroyuki Shinada, Yutaka Kaneko, Atsuko Takafuji, Hiroshi Toyama, Katsuya Sugiyama
  • Patent number: 6348690
    Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The novel inspection method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.
    Type: Grant
    Filed: August 7, 1998
    Date of Patent: February 19, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio Ichihashi, Satoru Fukuhara, Hiroyuki Shinada, Yutaka Kaneko, Katsuya Sugiyama, Atsuko Takafuji, Hiroshi Toyama
  • Publication number: 20010030294
    Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer.
    Type: Application
    Filed: June 19, 2001
    Publication date: October 18, 2001
    Applicant: Hitachi, Ltd.
    Inventors: Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio Ichihashi, Satoru Fukuhara, Hiroyuki Shinada, Yutaka Kaneko, Katsuya Sugiyama, Atsuko Takafuji, Hiroshi Toyama
  • Patent number: 6161592
    Abstract: A heat-resistant hose for transport of high temperature fluid, wherein the inner surface of the hose in contact with said fluid comprises a material containing blended rubber of fluorinated rubber (FKM) and acrylic rubber (ACM). In particular, a heat-resistant hose for transport of fluid containing high temperature oil which comprises an inner tubular body composed of one or more layers at least the most inner layer of which consists of blended rubber of FKM and ACM, fiber reinforcements wound around the outer surface of said inner tubular body the thread extracting force of which the fiber reinforcements is not less than 1N/mm, and an outer tubular body composed of one or more layers bonded on the surface of said fiber reinforcements, said most inner layer preferably containing carbon black having the value (A.times.B) of not more than 3500 obtained by multiplying the value A of nitrogen adsorption specific surface area (m.sup.
    Type: Grant
    Filed: March 24, 1999
    Date of Patent: December 19, 2000
    Assignee: Tokai Rubber Industries, Ltd.
    Inventors: Yasuo Yamamoto, Shinobu Kanbe, Masashi Kondo, Hiroyoshi Mori
  • Patent number: 5483589
    Abstract: In a routing control apparatus and method for a composite network, a decision is automatically made as to whether a connection to a public telephone network via a leased line is allowed, by examining the dial information entered from a calling party and judging the communications applicable to the receiving node, the type of communication requested, and other factors. A connection judging unit extracts, from the dial information entered by the calling party, a node identifier CC for specifying the receiving node and a connecting type identifier V/F for directing the initiation of judgment as to whether a connection to a public network via a leased line is allowed and for providing a parameter for determining the type of communication requested, and which judges, based on the extracted identifiers CC and V/F, whether a connection to a public telephone network accommodating the called party is allowed via a leased line destined for a receiving node.
    Type: Grant
    Filed: March 30, 1993
    Date of Patent: January 9, 1996
    Assignee: Fujitsu Limited
    Inventors: Kazunori Ishida, Tadao Ishii, Hiroyoshi Mori, Susumu Akizuki, Akihisa Ogino
  • Patent number: 5463221
    Abstract: When an image display unit displays a magnified image of an object being examined, a measuring unit automatically computes the dimensions of the image at the preset position. A tolerance range setting unit has been supplied with an upper and a lower limit value according to which it can judge the dimensions of the object at the preset position to be normal, whereas a comparison-decision unit decides that the dimensions thus computed are held between the upper and lower limit values. When the measured result is found outside the range of upper to lower limit values, the right-or-wrong decision data is stored in a memory and is redisplayed in the form of an image by the image display unit at proper timing.
    Type: Grant
    Filed: March 23, 1994
    Date of Patent: October 31, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Tadashi Otaka, Hiroyoshi Mori, Hideo Todokoro
  • Patent number: 5136387
    Abstract: An RF modulator according to this invention is constructed so as to allow channel setting without a test pattern generator. Specifically, the RF comprises an A/D converter for digitizing the TV channel setting data, an oscillator control circuit for controlling both the audio carrier oscillation and the RF carrier oscillation on the basis of the channel setting data digitized by the A/D converter, a signal adder for combining the video signal amplitude-modulated at the frequency of the RF carrier oscillation with the audio signal frequency/amplitude-modulated at the frequency of the audio carrier oscillation, channel picking-up means for picking up a portion near the center of each channel in the channel setting data, and a clipper circuit for cutting of the video signal at both ends of each channel setting range that have not been picked up by the channel picking-up means.
    Type: Grant
    Filed: April 22, 1991
    Date of Patent: August 4, 1992
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiroyoshi Mori, Shigetaka Sawa
  • Patent number: 4750200
    Abstract: A call meter signal receiver is provided for a subscriber's private metering system operated by a call meter signal sent from a central office. The receiver is operable both by common mode and normal mode signals. The receiver is small sized and can be installed in a central office trunk of private branch exchanger equipment. The call meter signal receiver is composed of a frequency tuned receiver including two buffer circuits, the first one for receiving the common mode and the second one for receiving the normal mode signal. The first buffer circuit is connected to the input side of a hybrid circuit of the COT, and has a high impedance, while the second buffer circuit, for receiving the normal mode signal, is connected to one of the output terminals of the hybrid circuit, and has a high impedance for voice signals.
    Type: Grant
    Filed: March 20, 1987
    Date of Patent: June 7, 1988
    Assignee: Fujitsu Limited
    Inventors: Kazuhiro Sato, Yoshimi Iijima, Hiroyoshi Mori
  • Patent number: 4670874
    Abstract: A communications system for transmitting and receiving data and voice signals simultaneously on 2-wire signal lines, which superposes and extracts high frequency modulated data signals using a high frequency transformer which is coupled to the 2-wire signal line. The transformer has two windings which are short-circuited with respect to high frequency components, but which pass low frequency voice signals between the 2-wire signal line and a low frequency hybrid circuit.
    Type: Grant
    Filed: December 13, 1984
    Date of Patent: June 2, 1987
    Assignee: Fujitsu Limited
    Inventors: Kazuhiro Sato, Yoshimi Iijima, Hiroyoshi Mori
  • Patent number: 4661879
    Abstract: An overcurrent protection circuit including a first transistor, a second transistor, and an integrator. The first transistor operates to control a current flow from a power source to a load. The second transistor is turned on when an overcurrent flows through the first transistor. The overcurrent is detected by watching the collector-emitter voltage of the first transistor. Thus, the second transistor operates to bypass the base current to be supplied to the first transistor with a certain delay time defined by a delay part, which enables an instantaneous overcurrent to be ignored.
    Type: Grant
    Filed: June 28, 1985
    Date of Patent: April 28, 1987
    Assignee: Fujitsu Limited
    Inventors: Kazuhiro Sato, Hiroyoshi Mori