Patents by Inventor Hiroyuki FUJIBAYASHI

Hiroyuki FUJIBAYASHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11009348
    Abstract: The interior of a first measurement surface and the interior of a second measurement surface traveling together with a measuring vehicle are scanned to acquire first measurement coordinate points and second measurement coordinate points, respectively. A first comparison point cloud representing a comparison part on a surface of a structure is extracted from the first measurement coordinate points. A second comparison point cloud representing a comparison part on the surface of the structure is extracted from the second measurement coordinate points. A difference between the first comparison point cloud and the second comparison point cloud corresponding to measurement of a common comparison part on the surface of the structure is calculated. Error having time dependence included in the first measurement coordinate points and the second measurement coordinate points is calculated on the basis of the calculated difference. The measurement coordinate points are corrected on the basis of the calculated error.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: May 18, 2021
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Katsuyuki Kamei, Masashi Watanabe, Hiroyuki Fujibayashi, Megumi Irie
  • Patent number: 11002552
    Abstract: A slope sample value at a sample point on a target route and a distance sample value from a reference point on the target route to the sample point are calculated based on three-dimensional position data of the target route. Undetermined elements contained in a model formula for the approximation formula representing relation between the slope sample value and the distance sample value are determined using an error evaluation formula for the model formula. The error evaluation formula contains a slope error evaluation component for evaluating a slope error between the slope sample value and a slope model value that is calculated using the model formula, and an altitude error evaluation component for evaluating an altitude error between an altitude model value that is obtained through integration of the slope model value and an altitude value that is obtained from the three-dimensional position data.
    Type: Grant
    Filed: January 6, 2017
    Date of Patent: May 11, 2021
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Masashi Watanabe, Katsuyuki Kamei, Hiroyuki Fujibayashi
  • Publication number: 20210033406
    Abstract: A map generation device is configured to determine evaluation value of each of a plurality of evaluation items that serve as indices for evaluation the reliability of the positional information of the planimetric feature. The plurality of evaluation items include any of an error amount when arrangement of composing points of the planimetric feature is approximated, a parallelism between an arrangement direction of composing points of the planimetric feature and a movement trajectory of the measuring vehicle, a distance between a position indicated by the position information of the planimetric feature and a position of the measuring vehicle when the position of the planimetric feature is measured, an absolute value of reflection intensity of a position of the planimetric feature obtained from the measurement information or a difference between a position of the planimetric feature and surrounding reflection intensity of the planimetric feature, and so on.
    Type: Application
    Filed: June 12, 2018
    Publication date: February 4, 2021
    Applicant: Mitsubishi Electric Corporation
    Inventors: Masashi WATANABE, Katsuyuki KAMEI, Hiroyuki FUJIBAYASHI, Takeo SAKAIRI, Ken SHIMAZAKI
  • Publication number: 20200149885
    Abstract: The interior of a first measurement surface and the interior of a second measurement surface traveling together with a measuring vehicle are scanned to acquire first measurement coordinate points and second measurement coordinate points, respectively. A first comparison point cloud representing a comparison part on a surface of a structure is extracted from the first measurement coordinate points. A second comparison point cloud representing a comparison part on the surface of the structure is extracted from the second measurement coordinate points. A difference between the first comparison point cloud and the second comparison point cloud corresponding to measurement of a common comparison part on the surface of the structure is calculated. Error having time dependence included in the first measurement coordinate points and the second measurement coordinate points is calculated on the basis of the calculated difference. The measurement coordinate points are corrected on the basis of the calculated error.
    Type: Application
    Filed: July 31, 2017
    Publication date: May 14, 2020
    Applicant: Mitsubishi Electric Corporation
    Inventors: Katsuyuki KAMEI, Masashi WATANABE, Hiroyuki FUJIBAYASHI, Megumi IRIE
  • Publication number: 20190063930
    Abstract: A slope sample value at a sample point on a target route and a distance sample value from a reference point on the target route to the sample point are calculated based on three-dimensional position data of the target route. Undetermined elements contained in a model formula for the approximation formula representing relation between the slope sample value and the distance sample value are determined using an error evaluation formula for the model formula. The error evaluation formula contains a slope error evaluation component for evaluating a slope error between the slope sample value and a slope model value that is calculated using the model formula, and an altitude error evaluation component for evaluating an altitude error between an altitude model value that is obtained through integration of the slope model value and an altitude value that is obtained from the three-dimensional position data.
    Type: Application
    Filed: January 6, 2017
    Publication date: February 28, 2019
    Applicant: Mitsubishi Electric Corporation
    Inventors: Masashi WATANABE, Katsuyuki KAMEI, Hiroyuki FUJIBAYASHI