Abstract: Various embodiments of systems and methods for calibrating wafer inspection system modules are disclosed herein. More specifically, the present disclosure provides various embodiments of systems and methods to calibrate the multiple spectral band values obtained from a substrate by a camera system included within a WIS module. In one embodiment, multiple spectral band values are red, green, and blue (RGB) values. As described in more detail below, the calibration methods disclosed herein may use a test wafer having a predetermined pattern of thickness changes or color changes to generate multiple spectral band offset values. The multiple spectral band offset values can be applied to the multiple spectral band values obtained from the substrate to generate calibrated RGB values, which compensate for spectral responsivity differences between camera systems included within a plurality of WIS modules.

Abstract: Camera images may be utilized to detect substrate edges and provide information regarding the centering of the substrate within the fluid dispense system. Camera images may also be utilized to monitoring the location of a cup within the fluid dispense system. The signal processing techniques utilized may include data smoothing, analyzing only certain wavelengths of reflected energy, transforming the data (in one embodiment utilizing a Fourier transform), and/or analyzing a sub-set of the collected pixels of data. The camera image data collected herein may be combined with a wide variety of other data so as to better monitor, characterize and/or control a substrate processing process flow.

Abstract: A load of a data channel at the time of data writing is reduced. A memory controller includes a specific data pattern retaining unit, a comparator, and an issuance unit. The specific data pattern retaining unit retains a specific data pattern. The comparator compares write data regarding a write command from a host computer with the specific data pattern. The issuance unit issues a specific write request that requests writing of the specific data pattern without supplying the write data to a memory in a case where the write data matches the specific data pattern.

Abstract: The write time is to be shortened in a storage device using memories that require different write times from each other, such as nonvolatile memories. In a memory controller including a plurality of write request holding units and a selection unit, the write request holding units holds a write request with respect to each of a plurality of memory modules that require different write times from one another. The selection unit selects one of the plurality of write request holding units in accordance with memory state information indicating whether each of the plurality of memory modules is in a busy state, and causes outputting of the write request.

Abstract: The order of read access to a memory is appropriately determined. A memory system includes a plurality of memories and a memory controller. The memory controller includes a memory write control unit and a memory read control unit. The memory write control unit generates a write request for any one of the plurality of memories on the basis of a write command from a computer. The memory read control unit generates a read request for any one of the plurality of memories according to priority corresponding to a data processing state of write data related to the write request in the memory write control unit on the basis of a read command from the computer.

Abstract: In a liquid dispense system, camera images may be utilized to identify puddle edges of a liquid dispensed on a substrate. The camera image may be used to determine the percentage of puddle coverage and puddling non-idealities. The camera within a fluid dispense system may also be utilized to monitor the intensity of wavelengths reflected from a substrate during a spin coating step. The reflected intensity as a function of time as a substrate is spin coated may be used to monitor and characterize a spin coating process. The reflected intensity as a function of time may be compared to other substrates to identify substrate to substrate film thickness variations. The analysis may be based upon peaks and/or troughs of the reflected intensity as a function of time.

Abstract: Various embodiments of systems and methods for calibrating wafer inspection system modules are disclosed herein. More specifically, the present disclosure provides various embodiments of systems and methods to calibrate the multiple spectral band values obtained from a substrate by a camera system included within a WIS module. In one embodiment, multiple spectral band values are red, green, and blue (RGB) values. As described in more detail below, the calibration methods disclosed herein may use a test wafer having a predetermined pattern of thickness changes or color changes to generate multiple spectral band offset values. The multiple spectral band offset values can be applied to the multiple spectral band values obtained from the substrate to generate calibrated RGB values, which compensate for spectral responsivity differences between camera systems included within a plurality of WIS modules.

Abstract: Camera images may be utilized to detect substrate edges and provide information regarding the centering of the substrate within the fluid dispense system. Camera images may also be utilized to monitoring the location of a cup within the fluid dispense system. The signal processing techniques utilized may include data smoothing, analyzing only certain wavelengths of reflected energy, transforming the data (in one embodiment utilizing a Fourier transform), and/or analyzing a sub-set of the collected pixels of data. The camera image data collected herein may be combined with a wide variety of other data so as to better monitor, characterize and/or control a substrate processing process flow.

Abstract: A load of a data channel at the time of data writing is reduced. A memory controller includes a specific data pattern retaining unit, a comparator, and an issuance unit. The specific data pattern retaining unit retains a specific data pattern. The comparator compares write data regarding a write command from a host computer with the specific data pattern. The issuance unit issues a specific write request that requests writing of the specific data pattern without supplying the write data to a memory in a case where the write data matches the specific data pattern.

Abstract: The order of read access to a memory is appropriately determined. A memory system includes a plurality of memories and a memory controller. The memory controller includes a memory write control unit and a memory read control unit. The memory write control unit generates a write request for any one of the plurality of memories on the basis of a write command from a computer. The memory read control unit generates a read request for any one of the plurality of memories according to priority corresponding to a data processing state of write data related to the write request in the memory write control unit on the basis of a read command from the computer.

Abstract: A data holding characteristic of a memory cell is improved in a memory system in which data is encoded and written to a memory cell. A first candidate parity generation unit generates, as a first candidate parity, a parity for detecting an error in an information section in which a predetermined value is assigned in a predetermined variable area. A second candidate parity generation unit generates, as a second candidate parity, a parity for detecting an error in the information section in which a value different from the predetermined value is assigned in the predetermined variable area. A selection unit selects a parity that satisfies a predetermined condition from among the first and second candidate parities as a selection parity. An output unit outputs a codeword constituted by the information section corresponding to the selection parity and the selection parity.

Abstract: Detecting a defective cell in a memory in consideration of an error property difference depending on the storage state. A determination unit determines whether there is a possibility of defect for each of unit-of-storages on a memory cell formed with a non-volatile memory. The non-volatile memory undergoes either a reset operation that transitions a state from a low resistive state (LRS) to a high resistive state (HRS) or a set operation that transitions the state from the high resistive state to the low resistive state. The determination unit determines a unit-of-storage in which the number of errors in predetermined one of the reset operation and the set operation has exceeded a predetermined standard, as a unit-of-storage suspected of having a defect.

Abstract: The write time is to be shortened in a storage device using memories that require different write times from each other, such as nonvolatile memories. In a memory controller including a plurality of write request holding units and a selection unit, the write request holding units holds a write request with respect to each of a plurality of memory modules that require different write times from one another. The selection unit selects one of the plurality of write request holding units in accordance with memory state information indicating whether each of the plurality of memory modules is in a busy state, and causes outputting of the write request.

Abstract: A storage device writes data at a high speed. The storage device is provided with a data area and a control unit. In the data area, a write position is specified by a write address. Also, the control unit writes the data in the write address when instructed to write the data in the write address, and generates an address different from the write address in which the writing is performed as an alternative write address and writes the data in the alternative write address when the writing of the data is unsuccessful.

Abstract: An access speed when a memory controller accesses a memory is improved. Each time any one of two different types of commands is input, a holding unit holds the input command. A priority mode switching unit switches a priority command which should have priority out of the two commands from one of the two commands to the other. A command processing unit preferentially extracts priority commands sequentially from the holding unit, and then sequentially extracts commands which are not the priority commands from the holding unit.

Abstract: A data holding characteristic of a memory cell is improved in a memory system in which data is encoded and written to a memory cell. A first candidate parity generation unit generates, as a first candidate parity, a parity for detecting an error in an information section in which a predetermined value is assigned in a predetermined variable area. A second candidate parity generation unit generates, as a second candidate parity, a parity for detecting an error in the information section in which a value different from the predetermined value is assigned in the predetermined variable area. A selection unit selects a parity that satisfies a predetermined condition from among the first and second candidate parities as a selection parity. An output unit outputs a codeword constituted by the information section corresponding to the selection parity and the selection parity.

Abstract: There is provided a storage apparatus that includes an address obtaining section, and a write processing section. The address obtaining section is configured to obtain a normal write address and an alternative write address before data writing to the normal write address, the normal write address being designated as a destination of the data writing, the alternative write address being used when the data writing is failed. The write processing section is configured to perform the data writing to the normal write address when instructed for the data writing, and perform the data writing to the alternative write address when the data writing to the normal write address is failed.

Abstract: Reduction in deterioration of a memory cell in a non-volatile memory is achieved. A memory controller is configured to include a time measuring unit, an elapsed time determination unit, and a read unit. The time measuring unit measures time elapsed from predetermined timing on an address where data written. The elapsed time determination unit determines whether the elapsed time exceeds a fixed amount of time upon receiving an instruction to read out the data from the address. The read control unit causes reading-out of the data from the address to pause in a case where the elapsed time is determined not to exceed the fixed amount of time.

Abstract: Detecting a defective cell in a memory in consideration of an error property difference depending on the storage state. A determination unit determines whether there is a possibility of defect for each of unit-of-storages on a memory cell formed with a non-volatile memory. The non-volatile memory undergoes either a reset operation that transitions a state from a low resistive state (LRS) to a high resistive state (HRS) or a set operation that transitions the state from the high resistive state to the low resistive state. The determination unit determines a unit-of-storage in which the number of errors in predetermined one of the reset operation and the set operation has exceeded a predetermined standard, as a unit-of-storage suspected of having a defect.

Abstract: The convenience of an information processing system is improved. In a memory controller of the information processing system, a request generation unit generates, with respect to a nonvolatile memory including a data area in which data is stored and a redundancy area in which a redundancy for performing error detection and error correction of the data is stored, a request of requesting writing or reading for any one of the data, and the redundancy, a code word constituted of the data and the redundancy. A control unit issues the generated request and controls writing and reading with respect to the nonvolatile memory.