Patents by Inventor Hisae Shibuya

Hisae Shibuya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230304713
    Abstract: A refrigerant quantity diagnosis device includes: an evaluation value calculation part that calculates a refrigerant quantity index evaluation value including a ratio of a measured refrigerant quantity index value to a reference refrigerant quantity index value in each of a normal period and a determination period; and a refrigerant quantity diagnosis part that diagnoses a refrigerant quantity based on the refrigerant quantity index evaluation value. The evaluation value calculation part calculates a first refrigerant quantity index evaluation value in the normal period and a second refrigerant quantity index evaluation value in the determination period, based on respective reference refrigerant quantity index values having respective values associated with an operating condition of interest, and respective measured refrigerant quantity index values.
    Type: Application
    Filed: December 8, 2022
    Publication date: September 28, 2023
    Inventors: Yoko KOKUGAN, Hiroshi KUSUMOTO, Keiko OKA, Hisae SHIBUYA, Noriyuki TOKURA, Norikazu SASAKI, Kazuhiro TSUCHIHASHI, Eiji OGATA
  • Patent number: 11378521
    Abstract: An optical condition determination system includes a simulation execution unit that performs an optical simulation on a surface texture model that models a surface texture of a target object of the appearance inspection, and a defect model that models a defect of the target object, under a plurality of optical conditions to generate a surface texture image and a defect image, an image synthesizing unit that synthesizes the surface texture image and the defect image generated by an optical simulation under the same optical condition to generate a synthetic image, an evaluation value calculating unit that calculates an evaluation value representing easiness of detecting the defect in the synthetic image, a correlation analysis unit that analyzes a correlation between an optical condition and the evaluation value corresponding to the synthetic image, and an optimum condition searching unit that searches for the optical condition suitable for the appearance inspection based on an analysis result of the correlatio
    Type: Grant
    Filed: July 8, 2020
    Date of Patent: July 5, 2022
    Assignee: HITACHI, LTD.
    Inventors: Hiroaki Kasai, Keiko Oka, Hisae Shibuya, Akio Yazaki
  • Patent number: 10977568
    Abstract: A phenomenon pattern extraction unit extracts a phenomenon pattern of a past sensor signal of a facility. A related information correlation unit correlates the sensor signal based on maintenance history information. A phenomenon pattern classification reference creation unit creates a classification reference for classifying a phenomenon pattern based on the extracted phenomenon pattern and a work keyword included in the maintenance history information correlated with the sensor signal as the source of the phenomenon pattern. A phenomenon pattern classification unit classifies the phenomenon pattern based on the classification reference. A diagnosis model creation unit creates a diagnosis model for estimating a work keyword suggested to a maintenance worker based on the classified phenomenon pattern and the work keyword.
    Type: Grant
    Filed: February 4, 2015
    Date of Patent: April 13, 2021
    Assignee: Hitachi Power Solutions Co., Ltd.
    Inventors: Hisae Shibuya, Shouzou Miyabe, Tadashi Suzuki
  • Publication number: 20210072162
    Abstract: An optical condition determination system includes a simulation execution unit that performs an optical simulation on a surface texture model that models a surface texture of a target object of the appearance inspection, and a defect model that models a defect of the target object, under a plurality of optical conditions to generate a surface texture image and a defect image, an image synthesizing unit that synthesizes the surface texture image and the defect image generated by an optical simulation under the same optical condition to generate a synthetic image, an evaluation value calculating unit that calculates an evaluation value representing easiness of detecting the defect in the synthetic image, a correlation analysis unit that analyzes a correlation between an optical condition and the evaluation value corresponding to the synthetic image, and an optimum condition searching unit that searches for the optical condition suitable for the appearance inspection based on an analysis result of the correlatio
    Type: Application
    Filed: July 8, 2020
    Publication date: March 11, 2021
    Inventors: Hiroaki Kasai, Keiko Oka, Hisae Shibuya, Akio Yazaki
  • Patent number: 9940184
    Abstract: In an anomaly detecting method by using multi-dimensional time series sensor signals including, generating anomaly model by using data of a learning period including neither that period nor any exclusion candidate period, calculating anomaly measurements on the basis of the distance from the normal model and, making a period containing the maximum anomaly measurement value but no exclusion candidate period, learning exclusion periods and anomaly determining thresholds are determined as learned data on the basis of the result in each round, generates anomaly model data in a learning period except learning-exclusion periods regarding acquired data or data in a designated evaluation period, an anomaly measurement at each time point is calculated on the basis of the distance from the normal model, and data at each time point is determined to be anomaly or normal by comparing the anomaly measurements with anomaly determining thresholds.
    Type: Grant
    Filed: December 12, 2014
    Date of Patent: April 10, 2018
    Assignees: HITACHI HIGH-TECHNOLOGIES CORPORATION, HITACHI POWER SOLUTIONS CO., LTD.
    Inventor: Hisae Shibuya
  • Patent number: 9933338
    Abstract: An objective is to identify the health state of mechanical equipment and provide information usable for determining maintenance work timing or the like. A health management system includes a time-series data acquisition unit configured to acquire multi-dimensional sensor data and environmental data from mechanical equipment; a first discrimination unit configured to quantify the equipment state of the mechanical equipment by a statistical method using normal data as learning data; a second discrimination unit configured to quantify the health state indicating the performance or quality of the mechanical equipment by a statistical method using normal data; and an output unit configured to display and/or output to the outside the quantified equipment state and health state.
    Type: Grant
    Filed: October 30, 2014
    Date of Patent: April 3, 2018
    Assignees: HITACHI POWER SOLUTIONS CO., LTD., TSURU EDUCATIONAL FOUNDATION
    Inventors: Toujirou Noda, Tadashi Suzuki, Naoki Miyakoshi, Toshiaki Kobari, Shouzou Miyabe, Hisae Shibuya, Shunji Maeda
  • Patent number: 9779495
    Abstract: To sensing an anomaly on the basis of a multi-dimensional time series sensor signal, in order to determine the next action for a countermeasure, survey, or the like, the present invention is configured such that a multi-dimensional feature vector for each time is extracted on the basis of a sensor signal, a reference feature vector for each time is extracted on the basis of a set of characteristic vectors for a predetermined learning period and the characteristic vector of each time, an anomaly measure is calculated on the basis of the difference between the feature vectors for the times and the reference feature vectors, an anomaly is detected by comparing the anomaly measure and a predetermined threshold value, and the anomaly-related sensor for the time the anomaly is detected is identified on the basis of a 2-dimensional distribution density of feature values.
    Type: Grant
    Filed: January 15, 2014
    Date of Patent: October 3, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Hisae Shibuya, Shunji Maeda
  • Patent number: 9659250
    Abstract: In case-based anomaly indication detection in a facility, there are problems such as error generation due to insufficient learning data or execution difficulty due to increased memory capacity and calculation time when the learning data period has been increased to obtain the learning data sufficiently. Provided is a method for monitoring facility state on the basis of a time series signal outputted from the facility, wherein an operation pattern label for each fixed interval is assigned on the basis of the time series signal, learning data is selected on the basis of the operation pattern label for each fixed interval, a normal model is created on the basis of the selected learning data, an anomaly measure is calculated on the basis of the time series signal and the normal model, and the facility state is determined to be anomaly or normal on the basis of the calculated anomaly measure.
    Type: Grant
    Filed: August 31, 2011
    Date of Patent: May 23, 2017
    Assignee: Hitachi Power Solutions Co., Ltd.
    Inventors: Hisae Shibuya, Shunji Maeda
  • Patent number: 9483049
    Abstract: Provided is an anomaly detection method and system capable of constructing determination condition rules of anomaly detection from case-based anomaly detection by way of multivariate analysis of a multi-dimensional sensor signal, applying the rules to design-based anomaly detection of individual sensor signals, and also appropriately executing setting and control of threshold values for highly sensitive, early, and clearly visible detection of anomalies. Anomaly detection on the basis of a case base by way of multivariate analysis controls design-based anomaly detection. That is to say, (1) anomaly detection on the basis of a case base performs selection of sensor signals and anomaly detection according to various types of anomalies. Specifically, anomaly detection (characteristic conversion), evaluation of level of effect of each signal, construction of determination conditions (rules), and display and selection of sensor signals corresponding to the anomaly are performed.
    Type: Grant
    Filed: June 16, 2010
    Date of Patent: November 1, 2016
    Assignee: Hitachi, Ltd.
    Inventors: Shunji Maeda, Hisae Shibuya
  • Patent number: 9465387
    Abstract: The anomaly diagnosis system includes the state measure calculator acquiring sensor data from sensors in a machine facility as time series data; an approximation formula calculator calculating a state measure being an index indicating a state of the machine facility, such as anomaly and a performance by a statistical method in which the time series data is used as learned data; and a state measure estimating unit estimating the state measures until future time using the approximation formula. Whenever the latest time series data is acquired, the reference period in which the time series data corresponding to the state measure referred to calculate the approximation formula by the reference period setting unit, is successively extended by addition of time when the latest time series data is acquired. The approximation formula calculator calculates the approximation formula using the state measure of the time series data acquired in the reference period.
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: October 11, 2016
    Assignee: Hitachi Power Solutions Co., Ltd.
    Inventors: Toujirou Noda, Shigeyoshi Chikuma, Masami Kusano, Naoki Miyakoshi, Tadashi Suzuki, Hisae Shibuya
  • Publication number: 20160202693
    Abstract: The anomaly diagnosis system includes the state measure calculator acquiring sensor data from sensors in a machine facility as time series data; an approximation formula calculator calculating a state measure being an index indicating a state of the machine facility, such as anomaly and a performance by a statistical method in which the time series data is used as learned data; and a state measure estimating unit estimating the state measures until future time using the approximation formula. Whenever the latest time series data is acquired, the reference period in which the time series data corresponding to the state measure referred to calculate the approximation formula by the reference period setting unit, is successively extended by addition of time when the latest time series data is acquired. The approximation formula calculator calculates the approximation formula using the state measure of the time series data acquired in the reference period.
    Type: Application
    Filed: December 29, 2015
    Publication date: July 14, 2016
    Inventors: Toujirou NODA, Shigeyoshi CHIKUMA, Masami KUSANO, Naoki MIYAKOSHI, Tadashi SUZUKI, Hisae SHIBUYA
  • Publication number: 20150363925
    Abstract: To sensing an anomaly on the basis of a multi-dimensional time series sensor signal, in order to determine the next action for a countermeasure, survey, or the like, the present invention is configured such that a multi-dimensional feature vector for each time is extracted on the basis of a sensor signal, a reference feature vector for each time is extracted on the basis of a set of characteristic vectors for a predetermined learning period and the characteristic vector of each time, an anomaly measure is calculated on the basis of the difference between the feature vectors for the times and the reference feature vectors, an anomaly is detected by comparing the anomaly measure and a predetermined threshold value, and the anomaly-related sensor for the time the anomaly is detected is identified on the basis of a 2-dimensional distribution density of feature values.
    Type: Application
    Filed: January 15, 2014
    Publication date: December 17, 2015
    Inventors: Hisae SHIBUYA, Shunji MAEDA
  • Publication number: 20150220847
    Abstract: A phenomenon pattern extraction unit extracts a phenomenon pattern of a past sensor signal of a facility. A related information correlation unit correlates the sensor signal based on maintenance history information. A phenomenon pattern classification reference creation unit creates a classification reference for classifying a phenomenon pattern based on the extracted phenomenon pattern and a work keyword included in the maintenance history information correlated with the sensor signal as the source of the phenomenon pattern. A phenomenon pattern classification unit classifies the phenomenon pattern based on the classification reference. A diagnosis model creation unit creates a diagnosis model for estimating a work keyword suggested to a maintenance worker based on the classified phenomenon pattern and the work keyword.
    Type: Application
    Filed: February 4, 2015
    Publication date: August 6, 2015
    Inventors: Hisae SHIBUYA, Shouzou MIYABE, Tadashi SUZUKI
  • Publication number: 20150213706
    Abstract: In a facility such as a plant, error detection can be performed by using characteristic amounts based on a statistical probability characteristic, but when sensor data is acquired at long sampling intervals for reducing costs, those intense changes cannot always be caught. Furthermore, when the sensor sampling time is not synchronized with the start of a sequence, a time difference occurs between sensor data obtained in the same sequence at different times, so it is not possible to determine a statistical probability characteristic for areas of intense change. Therefore, with the present invention a statistical probability characteristic for a time period to be monitored is calculated by estimating the sensor data that cannot be obtained, and error detection is performed on the basis of that statistical probability characteristic with respect to sequences with intense changes. Thus, it is possible to perform error detection with respect to sequences with intense changes.
    Type: Application
    Filed: July 5, 2013
    Publication date: July 30, 2015
    Applicant: Hitachi, Ltd.
    Inventors: Jie Bai, Hisae Shibuya, Shunji Maeda
  • Publication number: 20150169393
    Abstract: In an anomaly detecting method by using multi-dimensional time series sensor signals including, generating anomaly model by using data of a learning period including neither that period nor any exclusion candidate period, calculating anomaly measurements on the basis of the distance from the normal model and, making a period containing the maximum anomaly measurement value but no exclusion candidate period, learning exclusion periods and anomaly determining thresholds are determined as learned data on the basis of the result in each round, generates anomaly model data in a learning period except learning-exclusion periods regarding acquired data or data in a designated evaluation period, an anomaly measurement at each time point is calculated on the basis of the distance from the normal model, and data at each time point is determined to be anomaly or normal by comparing the anomaly measurements with anomaly determining thresholds.
    Type: Application
    Filed: December 12, 2014
    Publication date: June 18, 2015
    Inventor: Hisae SHIBUYA
  • Publication number: 20150160098
    Abstract: An objective is to identify the health state of mechanical equipment and provide information usable for determining maintenance work timing or the like. A health management system includes a time-series data acquisition unit configured to acquire multi-dimensional sensor data and environmental data from mechanical equipment; a first discrimination unit configured to quantify the equipment state of the mechanical equipment by a statistical method using normal data as learning data; a second discrimination unit configured to quantify the health state indicating the performance or quality of the mechanical equipment by a statistical method using normal data; and an output unit configured to display and/or output to the outside the quantified equipment state and health state.
    Type: Application
    Filed: October 30, 2014
    Publication date: June 11, 2015
    Inventors: Toujirou NODA, Tadashi SUZUKI, Naoki MIYAKOSHI, Toshiaki KOBARI, Shouzou MIYABE, Hisae SHIBUYA, Shunji MAEDA
  • Publication number: 20140279795
    Abstract: In case-based anomaly indication detection in a facility, there are problems such as error generation due to insufficient learning data or execution difficulty due to increased memory capacity and calculation time when the learning data period has been increased to obtain the learning data sufficiently. Provided is a method for monitoring facility state on the basis of a time series signal outputted from the facility, wherein an operation pattern label for each fixed interval is assigned on the basis of the time series signal, learning data is selected on the basis of the operation pattern label for each fixed interval, a normal model is created on the basis of the selected learning data, an anomaly measure is calculated on the basis of the time series signal and the normal model, and the facility state is determined to be anomaly or normal on the basis of the calculated anomaly measure.
    Type: Application
    Filed: August 31, 2011
    Publication date: September 18, 2014
    Applicant: Hitachi Power Solutions Co., Ltd.
    Inventors: Hisae Shibuya, Shunji Maeda
  • Patent number: 8824774
    Abstract: The pattern inspection apparatus of the present invention performs comparison between images of regions corresponding to patterns formed to be same patterns, thereby determining mismatch portions across the images to be defects. The apparatus includes multiple sensors that synchronously acquire images of shiftable multiple detection systems different from one another, and an image comparator section corresponding thereto. In addition, the apparatus includes a means for detecting a statistical offset value from the feature amount to be a defect, thereby properly detecting the defect even when a brightness difference is occurring in association with film a thickness difference in a wafer.
    Type: Grant
    Filed: June 17, 2013
    Date of Patent: September 2, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kaoru Sakai, Shunji Maeda, Hisae Shibuya, Hidetoshi Nishiyama
  • Publication number: 20140195184
    Abstract: Provided are an anomaly detection/diagnostic method and an anomaly detection/diagnostic system whereby it is possible, in equipment such as a plant, to detect anomalies promptly and with high sensitivity, wherein anomaly detection is carried out using operating information such as the operating time of the equipment and output signals from a plurality of sensors appended to the equipment, and wherein maintenance logs such as written procedure reports comprising procedure logs and instances of past countermeasures such as replacement part information are targeted to make associations between detected anomalies and countermeasures, and create links between anomaly detection and past maintenance logs, making reference to equipment records as well, while classifying and presenting anomalies that require action, thereby improving diagnostic accuracy.
    Type: Application
    Filed: May 30, 2012
    Publication date: July 10, 2014
    Applicant: Hitachi, Ltd
    Inventors: Shunji Maeda, Hisae Shibuya
  • Patent number: 8682824
    Abstract: This invention provides method for detecting advance signs of anomalies, event signals outputted from the facility are used to create a separate mode for each operating state, a normal model is created for each mode, the sufficiency of learning data for each mode is checked, a threshold is set according to the results of said check, and anomaly identification is performed using said threshold. Also, for diagnosis, a frequency matrix is created in advance, with result events on the horizontal axis and cause events on the vertical axis, and the frequency matrix is used to predict malfunctions. Malfunction events are inputted as result events, and quantized sensor signals having anomaly measures over the threshold are inputted as cause events.
    Type: Grant
    Filed: July 28, 2010
    Date of Patent: March 25, 2014
    Assignee: Hitachi, Ltd.
    Inventors: Hisae Shibuya, Shunji Maeda