Patents by Inventor Hisamitsu TAKEUCHI

Hisamitsu TAKEUCHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11280891
    Abstract: An underwater detection device may include a transmitter, which may include a transmitter, a receiver, and processing circuitry. The transmitter may be configured to transmit a transmission wave. The receiver may be configured to receive a reflection wave of the transmission wave. The processing circuitry may be configured to acquire a first position of a ship and a first measurement value that is a measurement result of the reflection wave at the first position, determine whether a relationship between the first position and a second position of the ship or another ship meets a given condition, and calculate a correction value based on the first measurement value and a second measurement value that is a measurement result of the reflection wave at the second position under a circumstance when the given condition is met.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: March 22, 2022
    Assignee: FURUNO ELECTRIC COMPANY LIMITED
    Inventors: Takuto Hazama, Hisamitsu Takeuchi, Satoshi Misonoo
  • Publication number: 20200018839
    Abstract: An underwater detection device may include a transmitter, which may include a transmitter, a receiver, and processing circuitry. The transmitter may be configured to transmit a transmission wave. The receiver may be configured to receive a reflection wave of the transmission wave. The processing circuitry may be configured to acquire a first position of a ship and a first measurement value that is a measurement result of the reflection wave at the first position, determine whether a relationship between the first position and a second position of the ship or another ship meets a given condition, and calculate a correction value based on the first measurement value and a second measurement value that is a measurement result of the reflection wave at the second position under a circumstance when the given condition is met.
    Type: Application
    Filed: July 10, 2019
    Publication date: January 16, 2020
    Applicant: FURUNO ELECTRIC CO., LTD.
    Inventors: Takuto HAZAMA, Hisamitsu TAKEUCHI, Satoshi MISONOO