Patents by Inventor Hisashi ENDOU

Hisashi ENDOU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220057789
    Abstract: A manufacturing monitoring assistance device includes: a model creation unit creating a computation model when a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit creating a corrective computation model when the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.
    Type: Application
    Filed: January 30, 2020
    Publication date: February 24, 2022
    Applicant: HITACHI, LTD.
    Inventors: Masanori KITAOKA, Hisashi ENDOU, Nobuhiro KAKENO, Hiroshi YOSHIKAWA, Toshihiro YAMADA
  • Patent number: 11150196
    Abstract: The disclosure provides a joining process line monitoring system capable of preventing joining quality deterioration and operation delay.
    Type: Grant
    Filed: August 30, 2018
    Date of Patent: October 19, 2021
    Assignee: HITACHI, LTD.
    Inventors: Hisashi Endou, Masanori Miyagi, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno, Yasunori Hama
  • Patent number: 11029254
    Abstract: There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration.
    Type: Grant
    Filed: July 11, 2018
    Date of Patent: June 8, 2021
    Assignee: HITACHI, LTD.
    Inventors: Ryoji Nakagawa, Hisashi Endou, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno
  • Publication number: 20210063316
    Abstract: The disclosure provides a joining process line monitoring system capable of preventing joining quality deterioration and operation delay.
    Type: Application
    Filed: August 30, 2018
    Publication date: March 4, 2021
    Inventors: Hisashi ENDOU, Masanori MIYAGI, Hiroshi YOSHIKAWA, Toshihiro YAMADA, Nobuhiro KAKENO, Yasunori HAMA
  • Patent number: 10935500
    Abstract: There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration.
    Type: Grant
    Filed: October 18, 2017
    Date of Patent: March 2, 2021
    Assignee: HITACHI, LTD.
    Inventors: Ryoji Nakagawa, Hisashi Endou, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno
  • Publication number: 20200361023
    Abstract: Provided is a welding management system that appropriately manages welding. The welding management system (100) includes a plurality of local magnetic sensors (10a to 10f) provided around a target joining position (K) and a correction magnetic sensor (20) curved to surround the target joining position (K). A data processing unit (30) generates information of a joining state of the target joining position (K) based on a difference between a detection value of each of the plurality of the local magnetic sensors (10a to 10f) and a detection value of the correction magnetic sensor (20).
    Type: Application
    Filed: March 30, 2018
    Publication date: November 19, 2020
    Inventors: Ryoji NAKAGAWA, Hisashi ENDOU, Hiroshi YOSHIKAWA, Toshihiro YAMADA, Nobuhiro KAKENO, Hideya ISAKA
  • Patent number: 10317368
    Abstract: A defect inspection device configured to measure a surface shape of an inspection target using light applied to the inspection target via a spatial light phase modulator based on an interference state of reflected light from the inspection target obtained via the spatial light phase modulator, to measure magnetic field distribution of a surface of the inspection target magnetized by an excitation device for magnetizing the inspection target using light applied to the inspection target via the spatial light phase modulator based on an interference state of reflected light from the inspection target obtained via the spatial light phase modulator, and to separate data of a magnetic field specific portion which exists on the surface of the inspection target from magnetic field distribution data which is a measurement result of magnetic field distribution of the inspection target based on surface shape data which is a measurement result of the surface shape of the inspection target, to suppress deterioration of me
    Type: Grant
    Filed: November 28, 2014
    Date of Patent: June 11, 2019
    Assignee: HITACHI, LTD.
    Inventors: Hisashi Endou, Hiroyuki Takagi, Taichi Goto, Mitsuteru Inoue
  • Publication number: 20180321162
    Abstract: There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration.
    Type: Application
    Filed: July 11, 2018
    Publication date: November 8, 2018
    Applicant: Hitachi, Ltd.
    Inventors: Ryoji NAKAGAWA, Hisashi ENDOU, Hiroshi YOSHIKAWA, Toshihiro YAMADA, Nobuhiro KAKENO
  • Patent number: 10122296
    Abstract: A diagnostic system for a power converter which includes a semiconductor device, and which performs a switching operation between conduction and interruption of the principal current flowing through a main circuit. The diagnostic system includes a current change amount calculation circuit for obtaining numeric data which reflects a current change amount of the principal current per unit time, a determination circuit for determining a state of the power converter by comparing the numeric data with a reference value, and an output circuit for outputting a determination result of the determination circuit.
    Type: Grant
    Filed: June 22, 2015
    Date of Patent: November 6, 2018
    Assignee: HITACHI, LTD.
    Inventors: Junichi Sakano, Kimihisa Furukawa, Takashi Ogawa, Hisashi Endou
  • Publication number: 20180123477
    Abstract: There is provided a diagnostic system for a power converter which includes a semiconductor device, and performs a switching operation between conduction and interruption of the principal current flowing through the main circuit. The diagnostic system includes a current change amount calculation circuit for obtaining numeric data which reflects a current change amount of the principal current per unit time, a determination circuit for determining a state of the power converter by comparing the numeric data with a reference value, and an output circuit for outputting a determination result of the determination circuit.
    Type: Application
    Filed: June 22, 2015
    Publication date: May 3, 2018
    Inventors: Junichi SAKANO, Kimihisa FURUKAWA, Takashi OGAWA, Hisashi ENDOU
  • Publication number: 20180113077
    Abstract: There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration.
    Type: Application
    Filed: October 18, 2017
    Publication date: April 26, 2018
    Applicant: Hitachi, Ltd.
    Inventors: Ryoji NAKAGAWA, Hisashi ENDOU, Hiroshi YOSHIKAWA, Toshihiro YAMADA, Nobuhiro KAKENO
  • Publication number: 20170328864
    Abstract: A defect inspection device configured to measure a surface shape of an inspection target using light applied to the inspection target via a spatial light phase modulator based on an interference state of reflected light from the inspection target obtained via the spatial light phase modulator, to measure magnetic field distribution of a surface of the inspection target magnetized by an excitation device for magnetizing the inspection target using light applied to the inspection target via the spatial light phase modulator based on an interference state of reflected light from the inspection target obtained via the spatial light phase modulator, and to separate data of a magnetic field specific portion which exists on the surface of the inspection target from magnetic field distribution data which is a measurement result of magnetic field distribution of the inspection target based on surface shape data which is a measurement result of the surface shape of the inspection target, to suppress deterioration of me
    Type: Application
    Filed: November 28, 2014
    Publication date: November 16, 2017
    Inventors: Hisashi ENDOU, Hiroyuki TAKAGI, Taichi GOTO, Mitsuteru INOUE