Patents by Inventor Hisashi Masumura

Hisashi Masumura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230411143
    Abstract: An epitaxial wafer cleaning method for cleaning a wafer having an epitaxial film formed on a front surface thereof, including: a first cleaning step of supplying a cleaning solution containing O3 to all surfaces, including front, back, and end surfaces, of the wafer to perform spin cleaning; a second cleaning step of supplying a cleaning solution to the back and end surfaces of the wafer to perform cleaning with a roll brush after the first cleaning step; a third cleaning step of supplying a cleaning solution containing O3 to the front surface of the wafer to perform spin cleaning after the second cleaning step; and a fourth cleaning step of supplying a cleaning solution containing HF to the front surface of the wafer to perform spin cleaning after the third cleaning step.
    Type: Application
    Filed: September 13, 2021
    Publication date: December 21, 2023
    Applicant: SHIN-ETSU HANDOTAI CO., LTD.
    Inventors: Norimichi TANAKA, Hisashi MASUMURA, Teppei NAKATA, Yuhei FUKAZU
  • Patent number: 9266216
    Abstract: The present invention provides a polishing head including: an annular rigid ring; an elastic film bonded to the rigid ring; and an upward and downward movable mid-plate, the mid-plate defining a first sealed space together with the rigid ring and the elastic film; an incompressible fluid enclosed in a sealed space; and a mid-plate positioning device for adjusting vertical position of the mid-plate, to hold a back surface of a workpiece on a lower surface of the elastic film and polish a front surface by bringing the front surface into contact with a polishing pad attached to a turn table, wherein the mid-plate can adjust a shape of the lower surface of the elastic film by adjusting the vertical position of the mid-plate. The polishing head polishes a workpiece without generating surface defects on the workpiece surface and easy detachment of the workpiece from a polishing pad after polishing.
    Type: Grant
    Filed: January 28, 2013
    Date of Patent: February 23, 2016
    Assignee: SHIN-ETSU HANDOTAI CO., LTD.
    Inventor: Hisashi Masumura
  • Publication number: 20150017890
    Abstract: The present invention provides a polishing head including: an annular rigid ring; an elastic film bonded to the rigid ring; and an upward and downward movable mid-plate, the mid-plate defining a first sealed space together with the rigid ring and the elastic film; an incompressible fluid enclosed in a sealed space; and a mid-plate positioning device for adjusting vertical position of the mid-plate, to hold a back surface of a workpiece on a lower surface of the elastic film and polish a front surface by bringing the front surface into contact with a polishing pad attached to a turn table, wherein the mid-plate can adjust a shape of the lower surface of the elastic film by adjusting the vertical position of the mid-plate. The polishing head polishes a workpiece without generating surface defects on the workpiece surface and easy detachment of the workpiece from a polishing pad after polishing.
    Type: Application
    Filed: January 28, 2013
    Publication date: January 15, 2015
    Inventor: Hisashi Masumura
  • Publication number: 20140113531
    Abstract: A polishing head comprising an annular rigid ring; a rubber film attached to the rigid ring by using uniform tensile force; a back plate that is connected to the rigid ring and forms a space portion with the rubber film and the rigid ring; and an annular template that is provided at a peripheral portion of a lower surface portion of the rubber film concentrically with the rigid ring and configured to hold an edge portion of a workpiece, the polishing head holding a back surface of the workpiece on the lower surface portion of the rubber film and sliding a front surface of the workpiece on a polishing pad attached to a turn table to perform polishing. The polishing head and the polishing apparatus can be used for final polishing and uniformly polish the entire front surface regardless of the thickness of the template.
    Type: Application
    Filed: May 31, 2012
    Publication date: April 24, 2014
    Applicant: SHIN-ETSU HANDOTAI CO., LTD.
    Inventor: Hisashi Masumura
  • Publication number: 20140101925
    Abstract: A polishing head configured to hold a workpiece at the time of polishing the workpiece by bringing a front surface of the workpiece into sliding contact with a polishing pad attached to on a turn table, the polishing head includes: a workpiece-holding board configured to hold a back surface of the workpiece, the workpiece-holding board being flexible and being composed of ceramics; a sealed space defined on a surface of the workpiece-holding board on an opposite side of a surface on which the workpiece is held; and a pressure-controlling device configured to control a pressure in the sealed space, the polishing head being capable of adjusting a shape of the flexible workpiece-holding board into a convex shape or a concave shape by controlling a pressure in the sealed space by the pressure-controlling device.
    Type: Application
    Filed: May 28, 2012
    Publication date: April 17, 2014
    Applicant: SHIN-ETSU HANDOTAI CO., LTD.
    Inventor: Hisashi Masumura
  • Patent number: 8636561
    Abstract: A polishing head for holding a workpiece when a surface of the workpiece is polished and a polishing apparatus provided with the polishing head, and more particularly a polishing head for holding the workpiece on a rubber film and a polishing apparatus provided with the polishing head. The polishing head and the polishing apparatus provided with the polishing head that can adjust the polishing profile on the basis of the shape of the workpiece before polishing and can stably obtain good flatness.
    Type: Grant
    Filed: August 7, 2009
    Date of Patent: January 28, 2014
    Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.
    Inventors: Hisashi Masumura, Hiromasa Hashimoto, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Publication number: 20120309175
    Abstract: According to the present invention, there is provided a vapor-phase growth semiconductor substrate support susceptor for supporting a semiconductor substrate at the time of vapor-phase growth, wherein the susceptor comprises a pocket portion in which the semiconductor substrate is arranged and has a taper portion having a taper formed such that an upper surface of the susceptor is inclined upwards or downwards from an edge of the pocket portion to an outer side. As a result, there can be provided the susceptor for supporting the semiconductor substrate at the time of vapor-phase growth that can improve flatness of an epitaxial wafer by controlling a layer thickness of an epitaxial layer at a peripheral portion on a main front surface side of the epitaxial wafer, and the epitaxial wafer manufacturing apparatus using this susceptor.
    Type: Application
    Filed: January 28, 2011
    Publication date: December 6, 2012
    Applicant: SHIN-ETSU HANDOTAI CO., LTD.
    Inventor: Hisashi Masumura
  • Patent number: 8323075
    Abstract: A polishing head having a disklike carrier in which an annular projecting portion and a carrier-engagement portion are formed in a peripheral portion, a disklike head body in which a head-body-engagement portion is formed outside, a diaphragm for connecting the head body with the carrier, a spacer located between the carrier-engagement portion and the head-body-engagement portion in a part of the carrier-engagement portion and/or the head-body-engagement portion, in which the spacer abuts on the carrier-engagement portion and/or the head-body-engagement portion at the time of lifting the head body so that the workpiece is demounted from the polishing pad by lifting the carrier with it inclined. As a result, there is provided a polishing head in which the workpiece can be easily, safely and surely demounted from the polishing pad by lifting the polishing head holding the workpiece without overhanging the polishing head from the turn table and the like.
    Type: Grant
    Filed: November 21, 2007
    Date of Patent: December 4, 2012
    Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.
    Inventors: Hisashi Masumura, Koji Kitagawa, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Patent number: 8268114
    Abstract: A workpiece holder for polishing includes a workpiece holder body having multiple perforated holes to hold a workpiece by vacuum suction. A holding surface of the workpiece holder body may be coated with resin. A coefficient of thermal expansion of the resin coating on the holding surface may be 1×10?5/K or less. The resin coating on the holding surface may be epoxy resin filled with silica particles.
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: September 18, 2012
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Hisashi Masumura, Fumio Suzuki, Kouji Kitagawa
  • Patent number: 8092281
    Abstract: The present invention is a polishing head provided with an annular rigid ring, a rubber film bonded to the rigid ring with a uniform tension, a mid plate joined to the rigid ring and forming a space portion together with the rubber film and the rigid ring, and an annular template provided concentrically with the rigid ring in a peripheral portion on a lower face part of the rubber film and having an outer diameter larger than an inner diameter of the rigid ring, in which a pressure of the space portion can be changed by a pressure adjustment mechanism, a back face of a work is held on the lower face part of the rubber film, and a surface of the work is brought into sliding contact with the polishing pad attached onto a turn table for performing polishing, and an inner diameter of the template is smaller than an inner diameter of the rigid ring, and a ratio between an inner diameter difference between the rigid ring and the template and a difference between the inner diameter and an outer diameter of the templ
    Type: Grant
    Filed: October 18, 2007
    Date of Patent: January 10, 2012
    Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.
    Inventors: Hisashi Masumura, Koji Kitagawa, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Patent number: 8021210
    Abstract: The present invention is a polishing head in which a rubber film is formed in a boot shape in such a manner that a position where the rubber film is held by a mid plate is distantly positioned from a work holding portion; an end portion of the boot shaped rubber film is formed in O-ring shape so that the rubber film is held by the mid plate with decreasing an area of contact between the mid plate and the rubber film as much as possible. As a result, there is provided a polishing head with rubber chuck method in which an occurrence of a surface defect, such as a scratch, on a surface of the work is suppressed as much as possible and the work can be uniformly and stably polished to the outer periphery.
    Type: Grant
    Filed: October 20, 2008
    Date of Patent: September 20, 2011
    Assignees: Shin-Etsu Handotai Co., Ltd., Fujikoshi Machinery Corp.
    Inventors: Hisashi Masumura, Kouji Morita, Hiromasa Hashimoto, Satoru Arakawa, Hiromi Kishida
  • Publication number: 20110136414
    Abstract: A polishing head for holding a workpiece when a surface of the workpiece is polished and a polishing apparatus provided with the polishing head, and more particularly a polishing head for holding the workpiece on a rubber film and a polishing apparatus provided with the polishing head. The polishing head and the polishing apparatus provided with the polishing head that can adjust the polishing profile on the basis of the shape of the workpiece before polishing and can stably obtain good flatness.
    Type: Application
    Filed: August 7, 2009
    Publication date: June 9, 2011
    Applicants: SHIN-ETSU HANDOTAI CO., LTD., FUJIKOSHI MACHINERY CORP.
    Inventors: Hisashi Masumura, Hiromasa Hashimoto, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Publication number: 20110070813
    Abstract: A method for manufacturing a polishing head having an annular rigid ring; a rubber film bonded to the rigid ring with uniform tension; a mid plate joined to the rigid ring, forming a space together with the rubber film and the rigid ring; and a mechanism for changing pressure of the space, the method including performing a tensile test on the rubber film according to JIS K6251 before bonding the rubber film to the rigid ring, and selecting the rubber film having a value of 10 MPa or less of an inclination obtained by a linear approximation of a stress-strain curve within a strain value of 5%; and bonding the selected rubber film having a value of 10 MPa or less of the inclination to the rigid ring to manufacture the polishing head.
    Type: Application
    Filed: June 2, 2009
    Publication date: March 24, 2011
    Applicants: SHIN-ETSU HANDOTAI CO., LTD., FUJIKOSHI MACHINERY CORP.
    Inventors: Hisashi Masumura, Hiromasa Hashimoto, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Publication number: 20100291838
    Abstract: The present invention is a polishing head in which a rubber film is formed in a boot shape in such a manner that a position where the rubber film is held by a mid plate is distantly positioned from a work holding portion; an end portion of the boot shaped rubber film is formed in O-ring shape so that the rubber film is held by the mid plate with decreasing an area of contact between the mid plate and the rubber film as much as possible. As a result, there is provided a polishing head with rubber chuck method in which an occurrence of a surface defect, such as a scratch, on a surface of the work is suppressed as much as possible and the work can be uniformly and stably polished to the outer periphery.
    Type: Application
    Filed: October 20, 2008
    Publication date: November 18, 2010
    Applicants: SHIN-ETSU HANDOTAI CO., LTD., FUJIKOSHI MACHINERY CORP.
    Inventors: Hisashi Masumura, Kouji Morita, Hiromasa Hashimoto, Satoru Arakawa, Hiromi Kishida
  • Publication number: 20100233945
    Abstract: A polishing head having a disklike carrier in which an annular projecting portion and a carrier-engagement portion are formed in a peripheral portion, a disklike head body in which a head-body-engagement portion is formed outside, a diaphragm for connecting the head body with the carrier, a spacer located between the carrier-engagement portion and the head-body-engagement portion in a part of the carrier-engagement portion and/or the head-body-engagement portion, in which the spacer abuts on the carrier-engagement portion and/or the head-body-engagement portion at the time of lifting the head body so that the workpiece is demounted from the polishing pad by lifting the carrier with it inclined. As a result, there is provided a polishing head in which the workpiece can be easily, safely and surely demounted from the polishing pad by lifting the polishing head holding the workpiece without overhanging the polishing head from the turn table and the like.
    Type: Application
    Filed: November 21, 2007
    Publication date: September 16, 2010
    Applicants: SHIN-ETSU HANDOTAI CO., LTD., FUJIKOSHI MACHINERY CORP.
    Inventors: Hisashi Masumura, Koji Kitagawa, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Publication number: 20100210192
    Abstract: The present invention is a polishing head having at least: an approximately discoid mid plate; a rubber film covering at least a lower face portion and a side face portion of the mid plate; and a space portion surrounded by the mid plate and the rubber film; in which pressure of the space portion can be changed by a pressure adjustment mechanism, a back surface of a workpiece is held on a lower face portion of the rubber film and a front surface of the workpiece is brought into sliding contact with a polishing pad attached onto a turn table for performing polishing; wherein the mid plate and the rubber film do not contact one another to have a gap at least throughout a whole of the lower face portion of the mid plate. As a result, there is provided a polishing head etc by a rubber chuck method in which a uniform polishing load is applied over the workpiece without influence of stiffness or flatness of the mid plate.
    Type: Application
    Filed: November 20, 2007
    Publication date: August 19, 2010
    Applicants: SHIN-ETSU HANDOTAI CO., LTD., FUJIKOSHI MACHINERY CORP.
    Inventors: Hisashi Masumura, Koji Kitagawa, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Patent number: 7740521
    Abstract: The present invention provides a polishing head 1 comprising a carrier 3, a guide ring 4, a dress ring 5, and a head body 2, wherein the head body 2 is rotatable, and holds the carrier 3, the guide ring 4, and the dress ring 5; the head body 2 has a reversed-bowl shape and has a hollow 8; the dress ring, and at least the guide ring or the carrier are held by being coupled to a lower brim of the head body via a diaphragm 6; the hollow of the head body is sealed. During polishing, the pressure of the sealed hollow is adjusted with a pressure regulating mechanism 9 communicating with the hollow, thereby elastically deforming the diaphragm. As a result, a wafer W can be polished while the wafer and the dress ring are pressed with a given pressing force against a polishing pad 11 on a turn table 12 with rotating the wafer held by the carrier and the dress ring.
    Type: Grant
    Filed: March 1, 2006
    Date of Patent: June 22, 2010
    Assignee: Shin-Etsu-Handotai Co., Ltd.
    Inventors: Hiromasa Hashimoto, Yasuharu Ariga, Hisashi Masumura, Kouzi Kitagawa, Toshimasa Kubota, Takahiro Matsuda
  • Patent number: 7695347
    Abstract: A method for polishing a wafer effectively preventing a sag in an outer peripheral portion of a wafer and a polishing pad for polishing a wafer preferably used in the method for polishing a wafer are provided. The method for polishing a wafer comprises the step of: mirror-polishing a wafer with a main surface of the wafer being in contact with a polishing pad of non-woven fabric impregnated with resin, wherein a ratio of surface roughness of the polishing pad to compressibility thereof {surface roughness Ra (?m)/compressibility (%)} is 3.8 or more.
    Type: Grant
    Filed: October 25, 2002
    Date of Patent: April 13, 2010
    Assignees: Shin-Etsu Handotai Co., Ltd., Rodel Nitta Company
    Inventors: Hisashi Masumura, Kazuya Tomii, Shigenao Ito, Kenichi Anzai, Kenichi Inoue
  • Publication number: 20090291623
    Abstract: The present invention is a polishing head provided with an annular rigid ring, a rubber film bonded to the rigid ring with a uniform tension, a mid plate joined to the rigid ring and forming a space portion together with the rubber film and the rigid ring, and an annular template provided concentrically with the rigid ring in a peripheral portion on a lower face part of the rubber film and having an outer diameter larger than an inner diameter of the rigid ring, in which a pressure of the space portion can be changed by a pressure adjustment mechanism, a back face of a work is held on the lower face part of the rubber film, and a surface of the work is brought into sliding contact with the polishing pad attached onto a turn table for performing polishing, and an inner diameter of the template is smaller than an inner diameter of the rigid ring, and a ratio between an inner diameter difference between the rigid ring and the template and a difference between the inner diameter and an outer diameter of the templ
    Type: Application
    Filed: October 18, 2007
    Publication date: November 26, 2009
    Applicants: SHIN-ETSU HANDOTAI CO., LTD., FUJIKOSHI MACHINERY CORP.
    Inventors: Hisashi Masumura, Koji Kitagawa, Kouji Morita, Hiromi Kishida, Satoru Arakawa
  • Patent number: 7582221
    Abstract: The present invention provides a wafer manufacturing method and a wafer polishing apparatus which enable control of sags in a periphery of a wafer and improvement of nanotopology values thereof that is strongly required recently, and a wafer. In a polishing process for making a mirror surface of the wafer, a back surface of the wafer is polished to produce a reference plane thereof.
    Type: Grant
    Filed: October 22, 2001
    Date of Patent: September 1, 2009
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Shigeyoshi Netsu, Hisashi Masumura