Patents by Inventor Hisashi Oikawa

Hisashi Oikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing system for semiconductor device
    Patent number: 6459292
    Abstract: A testing system for a semiconductor device having a tester carrying out a test for a semiconductor device, a host computer carrying out a repair analysis processing, a tester controller instructing the tester to operate the test and notifying the test result to the host computer. The host computer has a stay-and-resident program necessary for the analytical processing and sends those data to the tester controller in the point in which data showing “repairable or not” is detected.
    Type: Grant
    Filed: April 13, 2000
    Date of Patent: October 1, 2002
    Assignee: Advantest Corporation
    Inventors: Hisashi Oikawa, Yasuo Watanabe