Patents by Inventor Hisashi Shiraiwa

Hisashi Shiraiwa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190331842
    Abstract: A confocal optical system-based measurement apparatus includes: a light source; a light projecting optical fiber group; a light receiving optical fiber group; a spectroscope; and a confocal optical system configured to condense each of a plurality of beams from a plurality of light projecting optical fibers to irradiate a sample therewith, and cause a plurality of beams from a plurality of condensing points on the sample to form images on the plurality of light receiving optical fibers, respectively, wherein the light projecting optical fiber group includes the plurality of light projecting optical fibers configured to receive light from the light source, the light receiving optical fiber group includes the plurality of light receiving optical fibers configured to guide received light to the spectroscope, the shape of an end face of the light projecting optical fiber group and the shape of an end face of the light receiving optical fiber group are in a mirror image relationship, and in the light projecting op
    Type: Application
    Filed: March 29, 2019
    Publication date: October 31, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Haruka OTSUKA, Hisashi SHIRAIWA, Tsutomu MIZUGUCHI
  • Publication number: 20190240848
    Abstract: A germ-free glove box includes: a housing in which a germ-free space is formed, the housing including a connector to which a container housing an object is connected; and a glove provided at a front plate of the housing to allow an operating personnel to perform an operation in the germ-free space from the outside of the housing. In this germ-free glove box, the connector is provided on an upper plate of the housing. In the germ-free glove box outside spaces beside the box are effectively utilized, and a large working space is secured at around the bottom surface of a germ-free space.
    Type: Application
    Filed: July 21, 2017
    Publication date: August 8, 2019
    Applicant: SINFONIA TECHNOLOGY CO., LTD.
    Inventors: Haruki TAKEUCHI, Takayuki YAMADA, Toru SAEKI, Takumi ONISHI, Hiroyuki UDA, Hisashi GOMI, Toshimitsu FUJI, Hirotsugu SHIRAIWA, Norihiko YAMAMOTO
  • Patent number: 10330530
    Abstract: A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: June 25, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hisashi Shiraiwa, Hiroyuki Sano
  • Publication number: 20190176157
    Abstract: A measurement apparatus includes: a sample holder on which a plurality of samples can be placed; a measurement unit configured to measure the plurality of samples placed on the sample holder; and a control unit configured to control a position of the measurement unit relative to a sample to be measured. The sample holder includes a substrate, and a holding unit configured to hold the sample. The substrate is provided with a plurality of holding units. The holding unit is configured to hold each of a plurality of samples having different shapes at a center position of the holding unit.
    Type: Application
    Filed: November 23, 2018
    Publication date: June 13, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventor: Hisashi SHIRAIWA
  • Publication number: 20180058927
    Abstract: A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.
    Type: Application
    Filed: March 24, 2015
    Publication date: March 1, 2018
    Inventors: Hisashi SHIRAIWA, Hiroyuki SANO
  • Patent number: 9891105
    Abstract: A microspectroscope includes: a light source; a plurality of light projecting optical fibers that receive light from the light source; a spectroscope; a plurality of light receiving optical fibers for guiding received light to the spectroscope; and a confocal optical system for causing each of a plurality of beams from the plurality of light projecting optical fibers to be condensed and irradiated onto a sample, and forming images of a plurality of beams from a plurality of condensing points on the sample, respectively on the plurality of light receiving optical fibers.
    Type: Grant
    Filed: July 14, 2016
    Date of Patent: February 13, 2018
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Hisashi Shiraiwa
  • Patent number: 9746374
    Abstract: A spectrophotometer includes a photodetection unit configured to convert received light into an electric signal to output the electric signal; a circuit unit including a plurality of gain amplifiers and a plurality of AD converters configured to amplify an output signal from the photodetection unit by a plurality of gains using the plurality of gain amplifiers and configured to convert the amplified output signals into digital signals using the plurality of AD converters to output the digital signals as a plurality of pieces of light amount data; a saturation determination unit configured to determine whether or not each of the plurality of pieces of light amount data from the circuit unit has been saturated; and a measurement result calculation unit configured to calculate, in accordance with a result of the determination by the saturation determination unit, a measurement result of the received light using a part or all of the plurality of pieces of light amount data.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: August 29, 2017
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventor: Hisashi Shiraiwa
  • Publication number: 20170059407
    Abstract: A microspectroscope includes: a light source; a plurality of light projecting optical fibers that receive light from the light source; a spectroscope; a plurality of light receiving optical fibers for guiding received light to the spectroscope; and a confocal optical system for causing each of a plurality of beams from the plurality of light projecting optical fibers to be condensed and irradiated onto a sample, and forming images of a plurality of beams from a plurality of condensing points on the sample, respectively on the plurality of light receiving optical fibers.
    Type: Application
    Filed: July 14, 2016
    Publication date: March 2, 2017
    Applicant: Otsuka Electronics Co., Ltd.
    Inventor: Hisashi SHIRAIWA
  • Patent number: 9500520
    Abstract: An optical measurement apparatus includes: a hollow cylindrical member having one plane with a first opening and the other plane with a second opening; a rotation mechanism for rotating the cylindrical member about a first axis; a support unit for arranging a light source at a measurement position which is on the first axis and from which the emitted light enters the cylindrical member through the first opening; a first reflection unit arranged inside the cylindrical member for reflecting the light emitted from the light source and entering through the first opening; a second reflection unit for reflecting the light inside the cylindrical member and propagating the light through the second opening along the first axis to the outside of the cylindrical member; and at least one third reflection unit for causing the light reflected by the first reflection unit to be incident on the second reflection unit.
    Type: Grant
    Filed: July 30, 2012
    Date of Patent: November 22, 2016
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa
  • Patent number: 9127832
    Abstract: A light source support apparatus includes: a base member; a first support member supporting the base member rotatably about a first axis; first and second arm members connected respectively to opposite ends of the base member and extending in a direction parallel to the first axis; and a pair of second support members disposed at respective positions, which are opposite to each other, of the first and second arm members for supporting a sample light source. The pair of second support members is configured to be able to rotate the supported sample light source about a second axis orthogonal to the first axis. At least one of the first and second arm members is configured to be attachable to and detachable from the base member.
    Type: Grant
    Filed: January 30, 2013
    Date of Patent: September 8, 2015
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Hisashi Shiraiwa, Takeshi Kamada
  • Publication number: 20150241276
    Abstract: A spectrophotometer includes a photodetection unit configured to convert received light into an electric signal to output the electric signal; a circuit unit including a plurality of gain amplifiers and a plurality of AD converters configured to amplify an output signal from the photodetection unit by a plurality of gains using the plurality of gain amplifiers and configured to convert the amplified output signals into digital signals using the plurality of AD converters to output the digital signals as a plurality of pieces of light amount data; a saturation determination unit configured to determine whether or not each of the plurality of pieces of light amount data from the circuit unit has been saturated; and a measurement result calculation unit configured to calculate, in accordance with a result of the determination by the saturation determination unit, a measurement result of the received light using a part or all of the plurality of pieces of light amount data.
    Type: Application
    Filed: February 26, 2014
    Publication date: August 27, 2015
    Inventor: Hisashi Shiraiwa
  • Patent number: 8970835
    Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
    Type: Grant
    Filed: November 6, 2012
    Date of Patent: March 3, 2015
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa
  • Patent number: 8896824
    Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
    Type: Grant
    Filed: April 12, 2013
    Date of Patent: November 25, 2014
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa
  • Publication number: 20140021338
    Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
    Type: Application
    Filed: November 6, 2012
    Publication date: January 23, 2014
    Applicant: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Kazuaki OHKUBO, Hisashi SHIRAIWA
  • Publication number: 20140021340
    Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
    Type: Application
    Filed: April 12, 2013
    Publication date: January 23, 2014
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Kazuaki OHKUBO, Hisashi SHIRAIWA
  • Patent number: 7808625
    Abstract: Disclosed is an aperture variable inspection optical system including a variable aperture unit 13 having a polygonal light transparent section and light collecting systems 12a, 12b for forming an irradiation spot U of light passing through the variable aperture unit 13 at the position of a sample S. The variable aperture unit 13 is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
    Type: Grant
    Filed: August 29, 2007
    Date of Patent: October 5, 2010
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kenji Nakamura, Hisashi Shiraiwa
  • Publication number: 20080055592
    Abstract: Disclosed is an aperture variable inspection optical system including a variable aperture unit 13 having a polygonal light transparent section and light collecting systems 12a, 12b for forming an irradiation spot U of light passing through the variable aperture unit 13 at the position of a sample S. The variable aperture unit 13 is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
    Type: Application
    Filed: August 29, 2007
    Publication date: March 6, 2008
    Inventors: Kenji Nakamura, Hisashi Shiraiwa
  • Patent number: D851274
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: June 11, 2019
    Assignee: SINFONIA TECHNOLOGY CO., LTD.
    Inventors: Hisashi Gomi, Yusuke Yoda, Hirotsugu Shiraiwa