Patents by Inventor Hisasi Satow

Hisasi Satow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron microscope equipped with measuring facility
    Patent number: 4468560
    Abstract: Electron microscope imparted with measuring functions comprises an electron microscope system for forming an electron-microscopic image, a fluorescent screen for displaying the electron-microscopic image, and an optical microscope for observing the electron-microscopic image on the fluorescent screen. A pattern which provides convenience for measurements of the electron-microscopic image is imaged on an object plane of an eyepiece of the optical microscope.
    Type: Grant
    Filed: February 11, 1982
    Date of Patent: August 28, 1984
    Assignees: Hitachi, Ltd., Nissel Sangyo America, Ltd.
    Inventors: Morioki Kubozoe, Hisasi Satow, John E. Johnson, Jr.