Patents by Inventor Hisato Takehara

Hisato Takehara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8778268
    Abstract: Specimen analyzer includes a first holding section for holding a container; a first mechanism section for executing a first operation for the container on the first holding section; a second holding section for holding the container; a first transfer mechanism section for transferring the container from the first holding section to the second one; a second mechanism section for executing a second operation for the container on the second one; an error detector for detecting error in the first mechanism section; and an error controller for controlling the operation of the first holding section, the first and second operation so that the first operation and the transfer operation of the first holding section would be stopped while the second operation would be continued in case of the error in the first mechanism section. An abnormality control method of the analyzer and computer program product are also disclosed.
    Type: Grant
    Filed: October 21, 2008
    Date of Patent: July 15, 2014
    Assignee: Sysmex Corporation
    Inventors: Hisato Takehara, Yuji Wakamiya, Tomoyuki Nishida
  • Patent number: 8535607
    Abstract: The present invention is to present a sample analyzer which is capable of prevent consumable part which does not adapt to the sample analyzer from being used and maintain measurement precision. The sample analyzer 10 includes barcode reader 60 for obtaining serial number for identifying pipette tip 80 from barcode 83; containing section 21a for containing pipette tips 80 used by a predetermined mechanism section; CPU 34a for obtaining a number of the pipette tips 80 which have been used by the mechanism section; CPU 51a for obtaining a number of the usable pipette tips 80; warning screens 76, 77, 79 for giving a predetermined warning to a user, when the number obtained by CPU 34a is in a predetermined relationship with the number obtained by CPU 51a.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: September 17, 2013
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8425839
    Abstract: A sample analyzer is disclosed that comprising: a first reagent container to hold a first reagent container with a first record section which contains a first reagent management information; a second reagent container holder to hold a second reagent container with a second record section which contains a second reagent management information; a first information reader; a second information reader; a registration section for registering the combination of the first reagent and the second reagent based on the first reagent management information; a measurement section for conducting a measurement of a predetermined analysis item by using the first reagent and the second reagent corresponding to the combination registered by the registration section; and a processing section for processing a measurement result obtained by the measurement section, and for obtaining an analysis result of the sample.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: April 23, 2013
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8366998
    Abstract: A sample analyzer includes an order receiver for receiving an analyzing order of a sample having analyzing item information; an analyzing section for analyzing a sample according to the analyzing order received by the order receiver; a calculator for counting a first number of analyses by the analyzing section in a first counting period, and a second number of analyses by the analyzing section in a second counting period different from the first counting period; a selection receiver for receiving a selection of either one of the first counting period and the second counting period; an output section; and an output controller for outputting a number of analyses in the counting period received by the selection receiver to the output section based on the counted result by the calculator is disclosed. A sample analyzing method is also disclosed.
    Type: Grant
    Filed: September 19, 2008
    Date of Patent: February 5, 2013
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8335662
    Abstract: The invention provides a sample analyzer by which a position of any error status in the sample analyzer can be easily found by a user to allow the user to carry out an error recovery operation in an accurate and prompt manner. The sample analyzer 1 comprises a sensor for detecting a status of a measurement unit 2 including an error status; a display section 400b; and a controller 400a for controlling the display section 400b so as to display recovery information for recovering the measurement unit 2 from the error status and an error-occurring place image regarding a place where an error has occurred, when the sensor detects the error status of the measurement unit 2.
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: December 18, 2012
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8329103
    Abstract: An sample analyzer, which enables to confirm an analysis remaining time for each sample and a total analysis remaining time for all samples set in the analyzer, so that time management for both each sample and all samples can be easily performed, is disclosed. Specifically, an analyzing unit analyzes a sample by executing an analysis sequence including a predetermined number of analyzing steps, and an control device calculates an analysis remaining time for each sample based on the number of analyzing steps. Control device acquires a total analysis remaining time by calculating the analysis remaining time for the sample in which sample information is lastly inputted. The display member displays the analysis remaining time and the total analysis remaining time.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: December 11, 2012
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8279715
    Abstract: A sample analyzing apparatus is provided with a memory for storing a schedule of maintenance, a display, and a controller for displaying on the display a screen of calendar format, wherein the screen includes a date display area for displaying a date and a maintenance item display area for displaying a maintenance item scheduled on the date.
    Type: Grant
    Filed: September 12, 2011
    Date of Patent: October 2, 2012
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8231830
    Abstract: A sample analyzer: measures a measurement sample including a sample and a reagent; creates a calibration curve based on first measurement data obtained by measuring a measurement standard sample including a standard sample and the reagent; provides calibration curve specifying information for specifying the calibration curve to the calibration curve; acquires an analysis result by processing second measurement data obtained by measuring the measurement sample based on the calibration curve; and stores the analysis result and the calibration curve specifying information provided to the calibration curve used in the process of the second measurement data in correspondence to each other.
    Type: Grant
    Filed: March 18, 2008
    Date of Patent: July 31, 2012
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Publication number: 20120004742
    Abstract: A sample analyzing apparatus is provided with a memory for storing a schedule of maintenance, a display, and a controller for displaying on the display a screen of calendar format, wherein the screen includes a date display area for displaying a date and a maintenance item display area for displaying a maintenance item scheduled on the date.
    Type: Application
    Filed: September 12, 2011
    Publication date: January 5, 2012
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8071029
    Abstract: A sample analyzer and sample analyzing method perform following: a) mixing a sample with at least one of a first reagent and a second reagent, thereby preparing a measurement specimen; b) storing, in a memory, standard curve data corresponding to a reagent to be used in the step a) for preparing a measurement specimen; c) measuring the measurement specimen thereby obtaining measurement data; d) processing the measurement data based on the standard curve data, thereby obtaining an analysis result; and e) when the first, reagent and the second reagent are of the same type, determining a reagent to be used for the measuring between the first reagent and the second reagent, based on information regarding standard curve data stored in the memory.
    Type: Grant
    Filed: March 27, 2008
    Date of Patent: December 6, 2011
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 8040757
    Abstract: A sample analyzing apparatus is provided with a memory for storing a schedule of maintenance, a display, and a controller for displaying on the display a screen of calendar format, wherein the screen includes a date display area for displaying a date and a maintenance item display area for displaying a maintenance item scheduled on the date.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: October 18, 2011
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 7957935
    Abstract: An analyzer includes a specimen preparing section for preparing a measuring specimen including a specimen and a reagent, the specimen preparing section including a plurality of units; a detecting section for detecting a predetermined component from the specimen; a start command receiver for receiving a starting measurement instruction; a measurement controller for controlling the units and the detecting section when the starting measurement instruction is received; an error detecting section for detecting an error in the operations of the units; a measurement abort controller for stopping the operations of the units when the error is detected; a restart command receiver for receiving a restart measurement instruction after the abortion of the measurement; and a remeasurement controller for moving the units to initial positions thereof and controlling the units and the detecting section when the restarting measurement instruction is received is disclosed.
    Type: Grant
    Filed: October 20, 2008
    Date of Patent: June 7, 2011
    Assignee: Sysmex Corporation
    Inventors: Tomoyuki Nishida, Yuji Wakamiya, Hisato Takehara
  • Publication number: 20110077871
    Abstract: An analysis apparatus which has a first and second measuring units for measuring a clinical sample; and an information processing unit which is connected to the first and second measuring units so as to perform information communication with the first and second measuring units, wherein the first measuring unit is provided with a first marker, the second measuring unit is provided with a second marker, and the information processing unit has an information display section; and a display controller for displaying the first marker in association with the information relating to the first measuring unit on the information display section, and for displaying the second marker in association with the information relating to the second measuring unit on the information display section. Also, an information processing unit and an information displaying method.
    Type: Application
    Filed: September 27, 2010
    Publication date: March 31, 2011
    Inventors: Daigo Fukuma, Hisato Takehara
  • Publication number: 20100238043
    Abstract: The invention provides a sample analyzer by which a position of any error status in the sample analyzer can be easily found by a user to allow the user to carry out an error recovery operation in an accurate and prompt manner.
    Type: Application
    Filed: March 23, 2010
    Publication date: September 23, 2010
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Patent number: 7707010
    Abstract: The invention provides a sample analyzer by which a position of any error status in the sample analyzer can be easily found by a user to allow the user to carry out an error recovery operation in an accurate and prompt manner. The sample analyzer 1 comprises a sensor for detecting a status of a measurement unit 2 including an error status; a display section 400b; and a controller 400a for controlling the display section 400b so as to display recovery information for recovering the measurement unit 2 from the error status and an error-occurring place image regarding a place where an error has occurred, when the sensor detects the error status of the measurement unit 2.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: April 27, 2010
    Assignee: Sysmex Corporation
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Publication number: 20090292492
    Abstract: An analyzer includes a specimen preparing section for preparing a measuring specimen including a specimen and a reagent, the specimen preparing section including a plurality of units; a detecting section for detecting a predetermined component from the specimen; a start command receiver for receiving a starting measurement instruction; a measurement controller for controlling the units and the detecting section when the starting measurement instruction is received; an error detecting section for detecting an error in the operations of the units; a measurement abort controller for stopping the operations of the units when the error is detected; a restart command receiver for receiving a restart measurement instruction after the abortion of the measurement; and a remeasurement controller for moving the units to initial positions thereof and controlling the units and the detecting section when the restarting measurement instruction is received is disclosed.
    Type: Application
    Filed: October 20, 2008
    Publication date: November 26, 2009
    Applicant: SYSMEX CORPORATION
    Inventors: Tomoyuki NISHIDA, Yuji Wakamiya, Hisato Takehara
  • Publication number: 20090220379
    Abstract: An analyzer includes a measuring section for measuring samples; a transporting section for transporting a sample rack which holds sample container containing the sample to the measuring section; a motion controller for controlling the measuring section and the transporting section; an error detector for detecting an error of the analyzer; a display section; a display controller for displaying on the display section information representing handling of the sample rack present on the transporting section when the error detector detects the error; and a restart command receiver for receiving an instruction for measurement restart when the error occurs in the analyzer, wherein the motion controller controls the measuring section and the transporting section so as to selectively suction a sample required to be suctioned when the restart command receiver receives the instruction for measurement restart is disclosed. A measurement restarting method is also disclosed.
    Type: Application
    Filed: October 20, 2008
    Publication date: September 3, 2009
    Applicant: SYSMEX CORPORATION
    Inventors: Yuji WAKAMIYA, Hisato TAKEHARA
  • Publication number: 20090215184
    Abstract: A sample analyzer includes an order receiver for receiving an analyzing order of a sample having analyzing item information; an analyzing section for analyzing a sample according to the analyzing order received by the order receiver; a calculator for counting a first number of analyses by the analyzing section in a first counting period, and a second number of analyses by the analyzing section in a second counting period different from the first counting period; a selection receiver for receiving a selection of either one of the first counting period and the second counting period; an output section; and an output controller for outputting a number of analyses in the counting period received by the selection receiver to the output section based on the counted result by the calculator is disclosed. A sample analyzing method is also disclosed.
    Type: Application
    Filed: September 19, 2008
    Publication date: August 27, 2009
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
  • Publication number: 20090215183
    Abstract: Specimen analyzer includes a first holding section for holding a container; a first mechanism section for executing a first operation for the container on the first holding section; a second holding section for holding the container; a first transfer mechanism section for transferring the container from the first holding section to the second one; a second mechanism section for executing a second operation for the container on the second one; an error detector for detecting error in the first mechanism section; and an error controller for controlling the operation of the first holding section, the first and second operation so that the first operation and the transfer operation of the first holding section would be stopped while the second operation would be continued in case of the error in the first mechanism section. An abnormality control method of the analyzer and computer program product are also disclosed.
    Type: Application
    Filed: October 21, 2008
    Publication date: August 27, 2009
    Inventors: Hisato Takehara, Yuji Wakamiya, Tomoyuki Nishida
  • Publication number: 20090081794
    Abstract: An sample analyzer, which enables to confirm an analysis remaining time for each sample and a total analysis remaining time for all samples set in the analyzer, so that time management for both each sample and all samples can be easily performed, is disclosed. Specifically, an analyzing unit analyzes a sample by executing an analysis sequence including a predetermined number of analyzing steps, and an control device calculates an analysis remaining time for each sample based on the number of analyzing steps. Control device acquires a total analysis remaining time by calculating the analysis remaining time for the sample in which sample information is lastly inputted. The display member displays the analysis remaining time and the total analysis remaining time.
    Type: Application
    Filed: September 18, 2008
    Publication date: March 26, 2009
    Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara