Patents by Inventor Hisayoshi Tanaka

Hisayoshi Tanaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11966035
    Abstract: A light sheet microscope includes an irradiation optical system, a detection optical system, and a photodetector. The irradiation optical system includes a wavelength sweep light source which outputs light of which a wavelength changes with time as excitation light, a spectroscopic element on which the excitation light output from the wavelength sweep light source is incident and which emits the excitation light at an emission angle corresponding to a wavelength of the excitation light, a relay optical system which includes a cylindrical lens on which the excitation light emitted from the spectroscopic element is incident at an incident angle corresponding to the emission angle, and a first objective lens which condenses the excitation light guided by the relay optical system and irradiates the sample with the excitation light having a sheet shape.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: April 23, 2024
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Yuu Takiguchi, Rumika Tanaka, Hisayoshi Takamoto
  • Patent number: 5591406
    Abstract: An automatic exhaust gas analyzer for analyzing an exhaust gas of an internal combustion engine. The analyzer includes: a) plural analyzing units; b) two independent gas lines provided in each of the plural analyzing units; c) a gas-chromatographic column provided in each of the gas lines; d) a gas-chromatographic detector connected with the column in each of the gas lines; and e) a signal communication network interconnecting the gas-chromatographic detectors. Exhaust gas and the background gas are sampled at each stage of a predetermined run cycle, and are provided immediately to the two independent gas lines of the plurality of analyzing units respectively. Then the exhaust gas and background gas are analyzed in parallel in each of the plurality of analyzing units, which facilitates equalizing the measurement conditions of the two gases and the background correction of the measurement results of the exhaust gas can be made at high precision.
    Type: Grant
    Filed: September 13, 1995
    Date of Patent: January 7, 1997
    Assignees: Shimadzu Corporation, Honda Giken Kogyo Kabushiki Kaisha
    Inventors: Kenji Hirai, Akira Aono, Shinya Tsuneda, Hirokazu Matsumoto, Yuji Yamashita, Hisayoshi Tanaka, Takanori Shiina, Haruko Kaburagi