Patents by Inventor Hitendra Singh

Hitendra Singh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for tensile testing films
    Patent number: 11662283
    Abstract: A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: May 30, 2023
    Assignee: Dow Global Technologies LLC
    Inventors: Donald L. McCarty, II, William E. Gee, Paul OConnell, Jonathan J. Zieman, John Lund, Hitendra Singh, Scott J. Collick
  • System for analyzing impact and puncture resistance
    Patent number: 11441985
    Abstract: A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: September 13, 2022
    Assignees: Dow Global Technologies LLC, Rohm and Haas Company
    Inventors: Donald L. McCarty, II, Erick Sutanto, John Lund, Brayden E. Glad, Hitendra Singh
  • Device for analyzing impact and puncture resistance
    Patent number: 11313879
    Abstract: A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: April 26, 2022
    Assignees: Dow Global Technologies LLC, Rohm and Haas Company
    Inventors: Donald L. McCarty, II, Erick Sutanto, Larry Dotson, Brayden E. Glad, Hitendra Singh, John Lund
  • SYSTEM FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
    Publication number: 20210131933
    Abstract: A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.
    Type: Application
    Filed: April 30, 2018
    Publication date: May 6, 2021
    Applicants: Dow Global Technologies LLC, Rohm and Haas Company
    Inventors: Donald L. McCarty, II, Erick Sutanto, John Lund, Brayden E. Glad, Hitendra Singh
  • DEVICE FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
    Publication number: 20210088551
    Abstract: A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.
    Type: Application
    Filed: April 30, 2018
    Publication date: March 25, 2021
    Applicants: Dow Global Technologies LLC, Rohm and Haas Company
    Inventors: Donald L. McCarty, II, Erick Sutanto, Larry Dotson, Brayden E. Glad, Hitendra Singh, John Lund
  • SYSTEM FOR TENSILE TESTING FILMS
    Publication number: 20200166443
    Abstract: A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.
    Type: Application
    Filed: June 8, 2018
    Publication date: May 28, 2020
    Applicant: Dow Global Technologies LLC
    Inventors: Donald L. McCarty, II, William E. Gee, Paul OConnell, Jonathan J. Zieman, John Lund, Hitendra Singh, Scott J. Collick