Patents by Inventor Hitoshi Oba

Hitoshi Oba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12085424
    Abstract: In order to save on costs and space when processing analogue signals and pulse signals, a signal measurement unit (2) comprises: an input unit (21) which inputs an electrical signal from a device and selects whether to transmit the signal to an analogue measurement unit (22) or a counting measurement unit (23); the analogue measurement unit which measures voltage as an analogue value; and the counting measurement unit which counts the number of times that the voltage value has equaled or exceeded a first threshold value or the number of times that the voltage value has equaled or fallen below a second threshold value.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: September 10, 2024
    Assignee: OMRON Corporation
    Inventors: Masaya Kudo, Hitoshi Oba
  • Patent number: 11724332
    Abstract: Provided is an evaluation system including: an analog-to-digital converting section comprised of a programmable circuit and configured to convert an analog signal, the analog signal being acquired by a physical quantity acquiring section and indicative of a time-series change of at least one of (i) welding current, welding voltage, or load applied to pieces to be welded and (ii) a displacement, during welding, of a welding head; and an evaluating section configured to determine, based on a digital signal, whether or not the time-series change satisfies a predetermined condition, wherein configuration data for configuring the programmable circuit is arranged to be changeable by a user.
    Type: Grant
    Filed: March 11, 2019
    Date of Patent: August 15, 2023
    Assignee: OMRON Corporation
    Inventor: Hitoshi Oba
  • Patent number: 11640197
    Abstract: Provided is a counter unit capable of supporting any output apparatus of single-phase output, two-phase output, or three-phase output without waste. A counter unit (10) is provided with: a plurality of signal input terminals to which pulse signals outputted from a plurality of external output apparatuses (50) are respectively inputted; input circuits (21a to 21f) respectively connected to the plurality of signal input terminals; a single-phase counter (13) that performs count on the basis of a single-phase pulse signal, and a multi-phase counter (15) that performs count on the basis of a multi-phase pulse signal; and a switching part (16) that switches whether the input circuits (21a to 21f) are connected to the single-phase counter (13) or the multi-phase counter (15).
    Type: Grant
    Filed: March 2, 2020
    Date of Patent: May 2, 2023
    Assignee: OMRON Corporation
    Inventors: Hitoshi Oba, Masaya Kudo
  • Publication number: 20220196441
    Abstract: In order to save on costs and space when processing analogue signals and pulse signals, a signal measurement unit (2) comprises: an input unit (21) which inputs an electrical signal from a device and selects whether to transmit the signal to an analogue measurement unit (22) or a counting measurement unit (23); the analogue measurement unit which measures voltage as an analogue value; and the counting measurement unit which counts the number of times that the voltage value has equaled or exceeded a first threshold value or the number of times that the voltage value has equaled or fallen below a second threshold value.
    Type: Application
    Filed: March 10, 2020
    Publication date: June 23, 2022
    Applicant: OMRON Corporation
    Inventors: Masaya KUDO, Hitoshi OBA
  • Publication number: 20220121266
    Abstract: Provided is a counter unit capable of supporting any output apparatus of single-phase output, two-phase output, or three-phase output without waste. A counter unit (10) is provided with: a plurality of signal input terminals to which pulse signals outputted from a plurality of external output apparatuses (50) are respectively inputted; input circuits (21a to 21f) respectively connected to the plurality of signal input terminals; a single-phase counter (13) that performs count on the basis of a single-phase pulse signal, and a multi-phase counter (15) that performs count on the basis of a multi-phase pulse signal; and a switching part (16) that switches whether the input circuits (21a to 21f) are connected to the single-phase counter (13) or the multi-phase counter (15).
    Type: Application
    Filed: March 2, 2020
    Publication date: April 21, 2022
    Applicant: OMRON Corporation
    Inventors: Hitoshi OBA, Masaya KUDO
  • Patent number: 11126164
    Abstract: In the embodiments of the disclosure, a target signal which is a signal of a part used for subsequent processing is acquired from signals output from a device with higher accuracy. A control apparatus includes a first acquisition part which acquires a first signal of a time series output from a first device, a recording part which records a part of the first signal acquired by the first acquisition part, and a determination part which determines a timing at which the recording part records the first signal based on a preset predetermined condition.
    Type: Grant
    Filed: October 15, 2018
    Date of Patent: September 21, 2021
    Assignee: OMRON Corporation
    Inventors: Hitoshi Oba, Minoru Takahashi
  • Patent number: 11067967
    Abstract: In the embodiments of the disclosure, a target signal which is a signal of a part used for subsequent processing is acquired from signals output from a device with higher accuracy. A control apparatus includes a first acquisition part which acquires a first signal of a time series output from a first device, a recording part which records a part of the first signal acquired by the first acquisition part, and a determination part which determines a timing at which the recording part records the first signal based on a preset predetermined condition.
    Type: Grant
    Filed: October 15, 2018
    Date of Patent: July 20, 2021
    Assignee: OMRON Corporation
    Inventors: Hitoshi Oba, Minoru Takahashi
  • Publication number: 20200269343
    Abstract: Provided is an evaluation system including: an analog-to-digital converting section comprised of a programmable circuit and configured to convert an analog signal, the analog signal being acquired by a physical quantity acquiring section and indicative of a time-series change of at least one of (i) welding current, welding voltage, or load applied to pieces to be welded and (ii) a displacement, during welding, of a welding head; and an evaluating section configured to determine, based on a digital signal, whether or not the time-series change satisfies a predetermined condition, wherein configuration data for configuring the programmable circuit is arranged to be changeable by a user.
    Type: Application
    Filed: March 11, 2019
    Publication date: August 27, 2020
    Applicant: OMRON Corporation
    Inventor: Hitoshi OBA
  • Patent number: 10605688
    Abstract: A load cell input unit capable of determining whether load cell connection cables have a broken line is provided. When the load cell input unit (30) is in a broken line detection mode, a voltage applying element (311) applies a voltage to distribution lines of an amplifying element (31), and a broken line determination element (33) determines whether the load cell connection cables (40) have a broken line based on a voltage measured by a load measuring element (32).
    Type: Grant
    Filed: December 12, 2016
    Date of Patent: March 31, 2020
    Assignee: OMRON Corporation
    Inventors: Hitoshi Oba, Hiroki Miyake
  • Publication number: 20190235754
    Abstract: According to the disclosure, it is possible to perform comparison with high accuracy even if a deviation in the time axis direction occurs between the target signal and the comparison condition. A control apparatus includes a signal information recording part recording information indicating a temporal change of a time series signal output from a device; a comparison condition storage part storing information indicating a temporal change of a predetermined comparison condition; a shift part shifting one or both of the temporal change of the signal recorded in the signal information recording part and the temporal change of the comparison condition stored in the comparison condition storage part in a time axis direction to reduce a deviation in the time axis direction; and a comparison part comparing the signal with the comparison condition by using a temporal change after shifting performed by the shift part.
    Type: Application
    Filed: October 17, 2018
    Publication date: August 1, 2019
    Applicant: OMRON Corporation
    Inventors: Hitoshi OBA, Minoru TAKAHASHI
  • Publication number: 20190236048
    Abstract: According to the disclosure, it is possible to perform comparison with high accuracy even if a deviation in the time axis direction occurs between the target signal and the comparison condition. A control apparatus includes an acquisition part acquiring a time series signal output from a device; a comparison condition storage part storing information indicating a temporal change of a predetermined comparison condition; an area determination part determining a target area, which is an area satisfying a predetermined condition indicating that change of a value is stable, in the signal acquired by the acquisition part; and a comparison part performing comparison with the comparison condition by using a signal of the target area determined by the area determination part.
    Type: Application
    Filed: October 15, 2018
    Publication date: August 1, 2019
    Applicant: OMRON Corporation
    Inventors: Hitoshi OBA, Minoru TAKAHASHI
  • Publication number: 20190235476
    Abstract: In the embodiments of the disclosure, a target signal which is a signal of a part used for subsequent processing is acquired from signals output from a device with higher accuracy. A control apparatus includes a first acquisition part which acquires a first signal of a time series output from a first device, a recording part which records a part of the first signal acquired by the first acquisition part, and a determination part which determines a timing at which the recording part records the first signal based on a preset predetermined condition.
    Type: Application
    Filed: October 15, 2018
    Publication date: August 1, 2019
    Applicant: OMRON Corporation
    Inventors: Hitoshi OBA, Minoru TAKAHASHI
  • Publication number: 20170219452
    Abstract: A load cell input unit capable of determining whether load cell connection cables have a broken line is provided. When the load cell input unit (30) is in a broken line detection mode, a voltage applying element (311) applies a voltage to distribution lines of an amplifying element (31), and a broken line deteiiiiination element (33) determines whether the load cell connection cables (40) have a broken line based on a voltage measured by a load measuring element (32).
    Type: Application
    Filed: December 12, 2016
    Publication date: August 3, 2017
    Applicant: OMRON Corporation
    Inventors: Hitoshi OBA, Hiroki MIYAKE
  • Patent number: 8491157
    Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: July 23, 2013
    Assignee: OMRON Corporation
    Inventors: Hitoshi Oba, Naoki Nishimori, Akira Matsui, Nobuharu Ishikawa, Yoshihiro Yamashita, Takahiro Suga, Kosuke Sugiyama
  • Publication number: 20110222286
    Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.
    Type: Application
    Filed: March 10, 2011
    Publication date: September 15, 2011
    Applicant: OMRON CORPORATION
    Inventors: Hitoshi OBA, Naoki NISHIMORI, Akira MATSUI, Nobuharu ISHIKAWA, Yoshihiro YAMASHITA, Takahiro SUGA, Kosuke SUGIYAMA
  • Patent number: 7663759
    Abstract: An image taken by an imaging device is displayed on a display unit. When a confirmation instruction is inputted through an input unit, image teaching is performed while the image displayed on the display unit is set to a setting object image. A measurement item which is of a candidate of a measurement process including specification of a reference position is displayed as the measurement process to accept selection. Specification of cutout area which constitutes one measurement target region is accepted, a measurement point including a local region or a feature point which is used for the measurement is automatically set in the measurement target region based on pieces of information on the set measurement process and reference position.
    Type: Grant
    Filed: July 11, 2007
    Date of Patent: February 16, 2010
    Assignee: Omron Corporation
    Inventors: Tokiko Inoue, Yusuke Iida, Tatsuya Matsunaga, Hitoshi Oba
  • Patent number: 7520432
    Abstract: To enables realization of an image data collection function, a bank switch function and the like at low cost in a juxtaposedly placed type sensor system for handling an image, such as a visual sensor or a displacement sensor, by introduction of the minimum required number of new units into an existing system. A first operation of storing image data acquired by a sensor controller from a sensor head and/or measurement data obtained by processing the image data, into a non-volatile record medium of a data storage unit, and/or a second operation of writing the setting data having been stored into the non-volatile record medium of the data storage unit, on a bank memory inside the sensor controller unit, are made possible.
    Type: Grant
    Filed: August 31, 2005
    Date of Patent: April 21, 2009
    Assignee: Omron Corporation
    Inventors: Hiroyuki Inoue, Hitoshi Oba, Koji Shimada, Toru Hosoda, Naoya Nakashita, Hajime Takegawa, Kenji Horie, Takeshi Yoshiura, Mai Miyawaki
  • Publication number: 20080013103
    Abstract: An image taken by an imaging device is displayed on a display unit. When a confirmation instruction is inputted through an input unit, image teaching is performed while the image displayed on the display unit is set to a setting object image. A measurement item which is of a candidate of a measurement process including specification of a reference position is displayed as the measurement process to accept selection. Specification of cutout area which constitutes one measurement target region is accepted, a measurement point including a local region or a feature point which is used for the measurement is automatically set in the measurement target region based on pieces of information on the set measurement process and reference position.
    Type: Application
    Filed: July 11, 2007
    Publication date: January 17, 2008
    Inventors: Tokiko INOUE, Yusuke Iida, Tatsuya Matsunaga, Hitoshi Oba
  • Patent number: D540745
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: April 17, 2007
    Assignee: Omron Corporation
    Inventors: Hitoshi Oba, Masahiro Kawachi, Hiroyuki Inoue
  • Patent number: D567187
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: April 22, 2008
    Assignee: Omron Corporation
    Inventors: Hitoshi Oba, Masahiro Kawachi, Hiroyuki Inoue