Abstract: An electrical property testing device of an evaluation board includes a main circuit board, a voltage detecting unit, a storing unit, a processing unit and an adapter board. The voltage detecting unit is configured to detect a plurality of voltage values of the signal pads. The storing unit stores a plurality of standard voltage values corresponding to the signal pads. The processing unit is electrically connected to the voltage detecting unit and the storing unit. The processing unit receives the voltage values and determines whether the voltage values match the standard voltage values to generate a determining result. The adapter board includes a plurality of conductive pads. The conductive pads are correspondingly connected to the signal pads of the evaluation board. The voltage detecting unit detects the voltage values of the signal pads of the evaluation board via the conductive pads.

Abstract: An electrical property testing device of an evaluation board includes a main circuit board, a voltage detecting unit, a storing unit, a processing unit and an adapter board. The voltage detecting unit is configured to detect a plurality of voltage values of the signal pads. The storing unit stores a plurality of standard voltage values corresponding to the signal pads. The processing unit is electrically connected to the voltage detecting unit and the storing unit. The processing unit receives the voltage values and determines whether the voltage values match the standard voltage values to generate a determining result. The adapter board includes a plurality of conductive pads. The conductive pads are correspondingly connected to the signal pads of the evaluation board. The voltage detecting unit detects the voltage values of the signal pads of the evaluation board via the conductive pads.

Abstract: The present disclosure relates to a test socket for a chip, which comprises: a recess for receiving the chip and two push mechanisms. The recess is surrounded by four sections. The two push mechanisms are respectively arranged at two adjacent sections. Each of the two push mechanisms comprises: a push button, wherein a bottom of the push button is connected to a vertical elastic member; a pusher cooperated with the push button, wherein one end of the pusher extends into the recess and the opposite end of the pusher is connected to a lateral elastic member. When the push button is upwardly pushed by the vertical elastic member, a top of the push button protrudes from a top surface of the section and the pusher will be engaged with the push button. When the push button is pressed and moves downwardly, the lateral elastic member pushes the pusher to move toward the recess.

Abstract: A test device with a built-in test antenna is provided. The test device is applicable to a device under test having an antenna under test. The test device with a built-in test antenna includes: a test base board, a test socket, and an antenna assembly. The test base board is electrically connected to a test apparatus. The test socket is disposed on the test base board. The device under test is to be disposed on the test socket. The antenna assembly includes a test antenna and an antenna board. The antenna assembly is disposed inside the test socket so as to be coupled to the test antenna. The antenna board is electrically connected to the test base board, and the position of the test antenna corresponds to that of the antenna under test.

Abstract: A test device with a built-in test antenna is provided. The test device is applicable to a device under test having an antenna under test. The test device with a built-in test antenna includes: a test base board, a test socket, and an antenna assembly. The test base board is electrically connected to a test apparatus. The test socket is disposed on the test base board. The device under test is to be disposed on the test socket. The antenna assembly includes a test antenna and an antenna board. The antenna assembly is disposed inside the test socket so as to be coupled to the test antenna. The antenna board is electrically connected to the test base board, and the position of the test antenna corresponds to that of the antenna under test.

Abstract: The present disclosure relates to a test socket for a chip, which comprises: a recess for receiving the chip and two push mechanisms. The recess is surrounded by four sections. The two push mechanisms are respectively arranged at two adjacent sections. Each of the two push mechanisms comprises: a push button, wherein a bottom of the push button is connected to a vertical elastic member; a pusher cooperated with the push button, wherein one end of the pusher extends into the recess and the opposite end of the pusher is connected to a lateral elastic member. When the push button is upwardly pushed by the vertical elastic member, a top of the push button protrudes from a top surface of the section and the pusher will be engaged with the push button. When the push button is pressed and moves downwardly, the lateral elastic member pushes the pusher to move toward the recess.