Patents by Inventor Ho Jung Sun

Ho Jung Sun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210231593
    Abstract: The present disclosure relates to a method for providing cancer diagnosis information using a thermal analysis method and a portable cancer diagnosis device using a thermal analysis method. The method for providing cancer diagnosis information using a thermal analysis method according to the present disclosure is capable of diagnosing the type, progression, metastasis, etc. of cancer using the thermochemical reaction onset temperature, calorie change, etc. obtained by analyzing the heat flux to and from a biological sample. In addition, the portable cancer diagnosis device using a thermal analysis method of the present disclosure is capable of diagnosing the presence of cancer accurately and easily using the temperature function data depending on time measured by heating the biological sample.
    Type: Application
    Filed: July 19, 2019
    Publication date: July 29, 2021
    Applicant: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, KUNSAN NATIONAL UNIVERSITY
    Inventors: Ik Su JOO, Ho Jung SUN, Seong Hee YOO, Sang Bum LEE
  • Patent number: 6632683
    Abstract: Methods for forming capacitors of semiconductor devices, and more specifically, to a method for forming a capacitor having a stacked structure of metal layer-insulating film-metal layer and having its storage electrode formed of ruthenium (hereinafter, referred to as ‘Ru’) and dielectric layer formed of tantalum oxide (Ta2O5) film, which provides improved formation of dense Ru film using a CVD method at high temperature, thereby improving electrical characteristics of the capacitor.
    Type: Grant
    Filed: December 10, 2002
    Date of Patent: October 14, 2003
    Assignee: Hynix Semiconductor Inc
    Inventors: Kyong Min Kim, Ho-Jung Sun
  • Publication number: 20030109103
    Abstract: Methods for forming capacitors of semiconductor devices, and more specifically, to a method for forming a capacitor having a stacked structure of metal layer-insulating film-metal layer and having its storage electrode formed of ruthenium (hereinafter, referred to as ‘Ru’) and dielectric layer formed of tantalum oxide (Ta2O5) film, which provides improved formation of dense Ru film using a CVD method at high temperature, thereby improving electrical characteristics of the capacitor.
    Type: Application
    Filed: December 10, 2002
    Publication date: June 12, 2003
    Inventors: Kyong Min Kim, Ho-Jung Sun
  • Patent number: 6379977
    Abstract: A method of manufacturing a ferroelectric memory device which can improve the adhesion between an intermediate insulating layer and a lower electrode and the surface roughness of the lower electrode, is disclosed. According to the present invention, a titanium layer and a first platinum layer are sequentially formed on a semiconductor substrate on which a first intermediate insulating layer is formed. The substrate is then thermal-treated under oxygen atmosphere to transform the titanium layer and the first platinum layer into a titanium oxide layer containing platinum. Next, a second platinum layer for a lower electrode, a ferroelectric thin film and a third platinum layer for an upper electrode are formed on the titanium oxide layer containing platinum, in sequence. The third platinum layer is then etched to form the upper electrode and the ferroelectric thin film, the second platinum layer and the titanium oxide layer containing platinum are etched to form a capacitor.
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: April 30, 2002
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventors: Ho Jung Sun, Soon Yong Kweon, Seung Jin Yeom