Patents by Inventor Ho-Ki LYEO

Ho-Ki LYEO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images
    Patent number: 9459278
    Abstract: A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.
    Type: Grant
    Filed: July 6, 2015
    Date of Patent: October 4, 2016
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Yong-Hyun Kim, Ho-Ki Lyeo, Eui-Sup Lee
  • Computer-Aided Simulation Method For Atomic-Resolution Scanning Seebeck Microscope (SSM) Images
    Publication number: 20150309072
    Abstract: A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided.
    Type: Application
    Filed: July 6, 2015
    Publication date: October 29, 2015
    Inventors: Yong-Hyun KIM, Ho-Ki LYEO, Eui-Sup LEE
  • Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images
    Patent number: 9081030
    Abstract: A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.
    Type: Grant
    Filed: June 9, 2014
    Date of Patent: July 14, 2015
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Yong-Hyun Kim, Ho-Ki Lyeo, Eui-Sup Lee
  • Computer-Aided Simulation Method For Atomic-Resolution Scanning Seebeck Microscope (SSM) Images
    Publication number: 20140366229
    Abstract: A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided.
    Type: Application
    Filed: June 9, 2014
    Publication date: December 11, 2014
    Inventors: Yong-Hyun KIM, Ho-Ki LYEO, Eui-Sup LEE