Patents by Inventor Ho-Youn CHO

Ho-Youn CHO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240093307
    Abstract: The present disclosure relates to a serum exosomal SF3B4 marker composition for diagnosing early stage hepatocellular carcinoma for noninvasive in vitro diagnosis, wherein, by analyzing an expression level of SF3B4 in plasma proteins as well as expression of SF3B4 in exosomes present in sera of hepatocellular carcinoma patients, the possibility as the most suitable liquid biopsy marker was identified, and a new noninvasive biomarker with high diagnostic accuracy in early stage hepatocellular carcinoma for which no reliable biomarker exists at this present was discovered. As such, by using exosomes to identify cancer cell genomes and proteomes without biopsy, the exosomes are highly applicable in the future as a diagnostic biomarker that is useful in a disease group with a high risk in the biopsy such as hepatocellular carcinoma.
    Type: Application
    Filed: May 24, 2023
    Publication date: March 21, 2024
    Applicant: AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
    Inventors: Soon Sun KIM, Jung Woo EUN, Jae Youn CHEONG, Hyo Jung CHO, Ho Chul KANG, JuA SON
  • Publication number: 20140070800
    Abstract: A test apparatus can be provided which includes a test control unit configured to input electrical signals for testing a semiconductor device including a magneto-resistive element, and to receive test result signals from the semiconductor device. A station unit can be configured to support the semiconductor device during testing. A magnetic field generation unit can be configured to apply a magnetic field to the semiconductor device during testing. And a magnetic control unit can be configured to control the magnetic field generation unit. Using the test apparatus, characteristics of the semiconductor device can be tested during application of a magnetic field.
    Type: Application
    Filed: September 9, 2013
    Publication date: March 13, 2014
    Inventors: Ho-Youn CHO, Daeshik KIM, Dongseok CHO