Abstract: A Graphic Development Instrument System (GDIS) provides a method and capability to design, create and update display screens, including static elements (never change) and dynamic elements (change responsive to stimuli) and is able to include any controller function, without rewriting or modifyng the software. The GDIS enables a screen designer to create EPROMS for those screens for different for example vehicles or models.

Abstract: A computer based technician terminal is connected to a vehicle being serviced using an assembly line data link (ALDL) connection from an on-board computer. The data link provides status information and fault codes. The technician is led through various procedures. During set up, the technician connects an ALDL cable from the terminal to the vehicle, the vehicle indentification number (VIN) is entered and vehicle options are identified. A fault detection procedure (FDP) in the terminal detects vehicle malfunctions by interrogating data received (via the ALDL) from the on-board computer. A fault analysis procedure (FAP), using the fault codes from a table as arguments, does a sequential compare against the contents of a fault analysis table containing fault codes. In a fault sequencing procedure (FSP), for each fault code passed by the FAP, there is a list containing the name(s) of one or more isolation procedures.

Abstract: In a computerized automotive vehicle diagnostic system, a test probe cable is attached to individual components and consists of a multiple conductor cable which is attached ultimately to the component and to a computer in a technician terminal. Where the probe cable enters the technician terminal the conductors contained within it are fed into a programmable crosspoint switch which is controlled by a microcontroller. Test functions are provided by three programmable resources: (1) A program controlled multimeter, (2) A program controlled DC voltage source and ground sink; and (3) the microcontroller itself which receives and interprets commands from the computer and controls the various probe elements based upon the test commands received.

Abstract: Self-test techniques for checking driver circuits connected to a bus are described that particularly involve the detection and isolation of failures in off-chip-drivers and connections.

Abstract: A peripheral device address assignment mechanism is described which does not require the use of plugboards or jumpers. This mechanism enables a host processor to select any desired peripheral device and set its device address to any desired value at any desired time. This is accomplished by providing each peripheral device control unit with a loadable device address register for holding the device address assigned to its peripheral device. Each device control unit is further provided with circuitry responsive to the appearance of a unique I/O command on the processor I/O bus and to the activation of a unique set of the I/O bus data lines by the processor for loading into its device address register the desired device address value as supplied thereto by the processor via the I/O bus.