Patents by Inventor Holden Hackbarth

Holden Hackbarth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Same state and opposite state diagnostic test for ferroelectric memories
    Patent number: 5661730
    Abstract: A test method for ferroelectric memories includes the steps of: functionally testing the ferroelectric memories to determine functional yield; storing the ferroelectric memories for at least eight hours; writing an initial pattern into the ferroelectric memories; baking the ferroelectric memories; reading the initial pattern to determine same state yield; writing an inverse pattern into the ferroelectric memories; reading the inverse pattern to determine opposite state yield; and again writing the initial pattern into the ferroelectric memories. The steps of baking, reading the initial pattern and writing the inverse pattern, and reading the inverse pattern and writing the initial pattern are repeated for a number of test cycles. The ferroelectric memories are baked at a temperature of about 150.degree. C. for a predetermined duration that is incremented with each successive test cycle.
    Type: Grant
    Filed: September 27, 1996
    Date of Patent: August 26, 1997
    Assignee: Ramtron International Corporation
    Inventors: Sanjay Mitra, Holden Hackbarth