Abstract: A flash memory comprising a first plurality of memory cells, each memory cell of the first plurality of memory cells selectively connected to a first input of a comparator. A second plurality of memory cells selectively connected to a second input of the comparator, wherein a first number of the second plurality of memory cells are in an erased state, wherein a second number of the second plurality of memory cells are in a written state, wherein each memory cell of the first plurality of memory cells and each memory cell of the second plurality of memory cells has a first cell capacitance, and wherein the sum of the first number and the second number is at least three.

Abstract: A flash memory comprising a first plurality of memory cells, each memory cell of the first plurality of memory cells selectively connected to a first input of a comparator. A second plurality of memory cells selectively connected to a second input of the comparator, wherein a first number of the second plurality of memory cells are in an erased state, wherein a second number of the second plurality of memory cells are in a written state, wherein each memory cell of the first plurality of memory cells and each memory cell of the second plurality of memory cells has a first cell capacitance, and wherein the sum of the first number and the second number is at least three.

Abstract: Disclosed is an arrangement for testing an embedded circuit as part of a whole circuit located on a semiconductor wafer. Disclosed is an integrated semiconductor arrangement comprising a whole circuit (8) with inputs and outputs (7), an embedded circuit (1) that is part of the whole circuit (8) and is equipped with embedded inputs and outputs which are not directly connected to the inputs and outputs (7) of the whole circuit (8); a test circuit (2, 5, 6) that is connected to the embedded inputs and outputs in order to feed and read out signals during a test phase. A separate supply voltage connection (3) is provided which is used for separately supplying the embedded circuit (1) and the test circuit (2, 5, 6) independently of a supply voltage of the whole circuit (8) such that the inputs of the whole circuit do not have to be connected for testing the embedded circuit while only the inputs and outputs that are absolutely indispensable for testing the embedded circuit need to be connected to a test system.

Abstract: Disclosed is an arrangement for testing an embedded circuit as part of a whole circuit located on a semiconductor wafer. Disclosed is an integrated semiconductor arrangement comprising a whole circuit (8) with inputs and outputs (7), an embedded circuit (1) that is part of the whole circuit (8) and is equipped with embedded inputs and outputs which are not directly connected to the inputs and outputs (7) of the whole circuit (8); a test circuit (2, 5, 6) that is connected to the embedded inputs and outputs in order to feed and read out signals during a test phase. A separate supply voltage connection (3) is provided which is used for separately supplying the embedded circuit (1) and the test circuit (2, 5, 6) independently of a supply voltage of the whole circuit (8) such that the inputs of the whole circuit do not have to be connected for testing the embedded circuit while only the inputs and outputs that are absolutely indispensable for testing the embedded circuit need to be connected to a test system.