Patents by Inventor Holger Halberla

Holger Halberla has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for testing embedded circuits with test islands
    Patent number: 7994806
    Abstract: Embodiments of the present disclosure relate to a system and method for testing an embedded circuit in a semiconductor arrangement as part of an overall circuit that is located on a semiconductor wafer, the system and method comprising an arrangement comprising an overall circuit with at least one input and output. The overall circuit may be provided with an embedded circuit that is not directly connected to the inputs and outputs or may be connected thereto by being specially switched. Switching elements and test islands that are connected thereto may be provided such that the input or the output of the embedded circuit may be connected to the test islands via the switching elements in case of a test. The switching elements may be switched to said test mode in case of a test by applying a voltage to the test island, or the switching elements may be switched in this manner.
    Type: Grant
    Filed: December 9, 2005
    Date of Patent: August 9, 2011
    Assignee: X-Fab Semiconductor Foundries AG
    Inventors: Holger Halberla, Soeren Lohbrandt
  • Testing Embedded Circuits With The Aid Of Test Islands
    Publication number: 20100026334
    Abstract: Embodiments of the present disclosure relate to a system and method for testing an embedded circuit in a semiconductor arrangement as part of an overall circuit that is located on a semiconductor wafer, the system and method comprising an arrangement comprising an overall circuit with at least one input and output. The overall circuit may be provided with an embedded circuit that is not directly connected to the inputs and outputs or may be connected thereto by being specially switched. Switching elements and test islands that are connected thereto may be provided such that the input or the output of the embedded circuit may be connected to the test islands via the switching elements in case of a test. The switching elements may be switched to said test mode in case of a test by applying a voltage to the test island, or the switching elements may be switched in this manner.
    Type: Application
    Filed: December 9, 2005
    Publication date: February 4, 2010
    Inventors: Holger Halberla, Soeren Lohbrandt