Patents by Inventor Holger Saage

Holger Saage has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for objective and accurate thickness measurement of thin films on a microscopic scale
    Publication number: 20030222215
    Abstract: In a method and an apparatus for determining the thickness of a thin layer coated on a surface, a section is prepared and a digital image of the section is obtained. An intensity profile in the thickness direction of the layer is extracted from the digital image and is analyzed on the basis of predefined characteristics of the intensity profile to precisely determine the layer thickness. This technique is particularly advantageous in determining the layer thickness when said layer is formed on a curved surface.
    Type: Application
    Filed: October 31, 2002
    Publication date: December 4, 2003
    Inventors: Quentin de Robillard, Holger Saage, Heiko Stegmann, Hans-Jurgen Engelmann