Patents by Inventor Homem Cristo Prazeres da Costa

Homem Cristo Prazeres da Costa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for manufacturing smart card and identification devices and the like
    Patent number: 6756777
    Abstract: An automatic test system for testing smart card chips. The system includes synchronization circuitry that allows response signals generated at random times after a stimulus to be synchronized with a pattern generator. The described system has multiple paths in the synchronization circuitry that allows responses from several devices under test to be synchronized with each other so that parallel testing is supported. The system is well adapted for testing of smart card chips because such chips often respond to stimulus at random times. Other adaptations are included for testing of smart card chips. These adaptations include circuitry to generate a modulated RF carrier signal and signal processing circuitry that can detect modulation imposed on the RF carrier, allowing the smart card chip to be tested without modifications to the device for test access.
    Type: Grant
    Filed: August 1, 2002
    Date of Patent: June 29, 2004
    Assignee: Teradyne, Inc.
    Inventors: Homem Cristo Prazeres da Costa, Anton Thoma
  • Method for manufacturing smart card and identification devices and the like
    Publication number: 20020186004
    Abstract: An automatic test system for testing smart card chips. The system includes synchronization circuitry that allows response signals generated at random times after a stimulus to be synchronized with a pattern generator. The described system has multiple paths in the synchronization circuitry that allows responses from several devices under test to be synchronized with each other so that parallel testing is supported. The system is well adapted for testing of smart card chips because such chips often respond to stimulus at random times. Other adaptations are included for testing of smart card chips. These adaptations include circuitry to generate a modulated RF carrier signal and signal processing circuitry that can detect modulation imposed on the RF carrier, allowing the smart card chip to be tested without modifications to the device for test access.
    Type: Application
    Filed: August 1, 2002
    Publication date: December 12, 2002
    Inventors: Homem Cristo Prazeres da Costa, Anton Thoma
  • Test system for smart card and indentification devices and the like
    Patent number: 6466007
    Abstract: An automatic test system for testing smart card chips. The system includes synchronization circuitry that allows response signals generated at random times after a stimulus to be synchronized with a pattern generator. The described system has multiple paths in the synchronization circuitry that allows responses from several devices under test to be synchronized with each other so that parallel testing is supported. The system is well adapted for testing of smart card chips because such chips often respond to stimulus at random times. Other adaptations are included for testing of smart card chips. These adaptations include circuitry to generate a modulated RF carrier signal and signal processing circuitry that can detect modulation imposed on the RF carrier, allowing the smart card chip to be tested without modifications to the device for test access.
    Type: Grant
    Filed: August 14, 2000
    Date of Patent: October 15, 2002
    Assignee: Teradyne, Inc.
    Inventors: Homem Cristo Prazeres da Costa, Anton Thoma