Abstract: a G-LDPC decoder is provided. The G-LDPC decoder includes: a generalized check node decoder configured to, in each of a plurality of iterations: group connected variable nodes into groups, the connected variable nodes being connected to an mth generalized check node among generalized check nodes; generate test patterns in each of one or more of the groups based on a first message received by the mth generalized check node from the connected variable nodes; and identify a value of a second message to be provided from the mth generalized check node to the connected variable nodes based on the test patterns; and a LDPC decoder circuitry configured to, in each of the iterations, update a value of an nth variable node, among the variable nodes, based on the second message received by the nth variable node from a generalized check node that is connected to the nth variable node.

Abstract: Provided are an embedded DisplayPort (eDP) system and a method for controlling a panel self refresh mode. The eDP system enters a panel self refresh (PSR) mode when an image to display is static in a general mode, and a sink device recovers a stream clock for displaying a static image in the PSR mode.

Abstract: Disclosed herein is a circuit for controlling a variation in the frequency of a clock signal for blocking an unwanted variation in the frequency of the clock signal. When a frequency variation out of a set range is generated in a reference clock signal in the state in which the phases of the reference clock signal and a feedback clock signal have been locked, a control voltage for generating the feedback clock signal remains constant so that an abrupt variation generated in the frequency of the feedback clock signal is blocked.

Abstract: The wafer probe station includes: a plurality of the pressure sensors; a tilt correction unit which is constructed with a plurality of actuators, a plurality of displacement sensors which are disposed at positions adjacent to the corresponding actuators and a microcomputer; and a control unit which allows the wafer to be come in contact with the probe card by lifting up a Z-axis stage by a predetermined overdriving amount, extracts the pressure values of the installation positions from the pressure sensors, calculates driving amounts of the actuators of the tilt correction unit by using the pressure values so that a uniform load is applied to the chuck, calculates X and Y directional displacement values w occurring according to a change in a tilt of the chuck, lifts down the Z-axis stage, and after that, corrects an eccentric load of the chuck by driving the actuators of the tilt correction unit according to the driving amounts, and controls movement of the XY-axis stage by using the X and Y directional displ

Abstract: Disclosed herein is a circuit for controlling a variation in the frequency of a clock signal for blocking an unwanted variation in the frequency of the clock signal. When a frequency variation out of a set range is generated in a reference clock signal in the state in which the phases of the reference clock signal and a feedback clock signal have been locked, a control voltage for generating the feedback clock signal remains constant so that an abrupt variation generated in the frequency of the feedback clock signal is blocked.

Abstract: Provided are an embedded DisplayPort (eDP) system and a method for controlling a panel self refresh mode. The eDP system enters a panel self refresh (PSR) mode when an image to display is static in a general mode, and a sink device recovers a stream clock for displaying a static image in the PSR mode.

Abstract: The wafer probe station includes: a plurality of the pressure sensors; a tilt correction unit which is constructed with a plurality of actuators, a plurality of displacement sensors which are disposed at positions adjacent to the corresponding actuators and a microcomputer; and a control unit which allows the wafer to be come in contact with the probe card by lifting up a Z-axis stage by a predetermined overdriving amount, extracts the pressure values of the installation positions from the pressure sensors, calculates driving amounts of the actuators of the tilt correction unit by using the pressure values so that a uniform load is applied to the chuck, calculates X and Y directional displacement values w occurring according to a change in a tilt of the chuck, lifts down the Z-axis stage, and after that, corrects an eccentric load of the chuck by driving the actuators of the tilt correction unit according to the driving amounts, and controls movement of the XY-axis stage by using the X and Y directional displ

Abstract: Disclosed is a device for changing an inclination angle of a golf ball swing table.