Patents by Inventor Honglu Yu

Honglu Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7660440
    Abstract: A method for extracting feature information from product images using multivariate image analysis (MIA) to develop predictive models for organoleptic and other feature content and distribution on the imaged product. The imaging system is used to monitor product quality variables in an on-line manufacturing environment. The method may also be integrated into a closed-loop feedback control system in automated systems.
    Type: Grant
    Filed: April 27, 2004
    Date of Patent: February 9, 2010
    Assignee: Frito-Lay North America, Inc.
    Inventors: Wilfred Marcellien Bourg, Jr., Steven Andrew Bresnahan, Paul Allan Martin, John F. MacGregor, Honglu Yu, Mark-John Bruwer
  • Patent number: 7068817
    Abstract: A method for extracting feature information from product images using multivariate image analysis based on Principal Component Analysis (PCA) which is used to develop predictive models for feature content and distribution on the imaged product. The imaging system is used to monitor product quality variables in an on-line manufacturing environment. It may also be integrated into a closed-loop feedback control system in automated systems.
    Type: Grant
    Filed: November 7, 2002
    Date of Patent: June 27, 2006
    Assignee: McMaster University
    Inventors: Wilfred M. Bourg, Jr., Steven A. Bresnahan, Gabe Jan Haarsma, John F. MacGregor, Paul Allan Martin, Honglu Yu
  • Publication number: 20040091135
    Abstract: A method for extracting feature information from product images using multivariate image analysis based on Principal Component Analysis (PCA) which is used to develop predictive models for feature content and distribution on the imaged product. The imaging system is used to monitor product quality variables in an on-line manufacturing environment. It may also be integrated into a closed-loop feedback control system in automated systems.
    Type: Application
    Filed: November 7, 2002
    Publication date: May 13, 2004
    Inventors: Wilfred M. Bourg, Steven A. Bresnahan, Gabe Jan Haarsma, John F. MacGregor, Paul Allan Martin, Honglu Yu