Abstract: A set of high level test logic is configured to include a set of insertion points. The high-level test logic can be controlled to insert test conditions into a data center configuration. It can also be configured to execute remediation actions that are to be taken, and validation actions to be performed in order to determine whether the remediation action works against the test conditions. Different instances of the high-level test logic can be configured for different environments and different test conditions.

Abstract: A lifting storage device comprises multiple box bodies movably stacked up and down, X-shaped hinges are symmetrically arranged on two sides of the box body, a support frame slideway limiting plate is arranged below the box body, a bottom end of the X-shaped hinge is movably connected with the support frame slideway limiting plate, a box body front rotating shaft and a box body rear rotating shaft are arranged in front of and behind each box body, the front rotating shaft and the rear rotating shaft of each box body are connected with the X-shaped hinges in a staggered manner, each box body is obliquely lifted along with the X-shaped hinges after connection, a locking mechanism is arranged on the support frame slideway limiting plate corresponding to the X-shaped hinge and the locking mechanism is arranged in a final position of a slideway on the support frame slideway limiting plate.

Abstract: A lifting storage device comprises multiple box bodies movably stacked up and down, X-shaped hinges are symmetrically arranged on two sides of the box body, a support frame slideway limiting plate is arranged below the box body, a bottom end of the X-shaped hinge is movably connected with the support frame slideway limiting plate, a box body front rotating shaft and a box body rear rotating shaft are arranged in front of and behind each box body, the front rotating shaft and the rear rotating shaft of each box body are connected with the X-shaped hinges in a staggered manner, each box body is obliquely lifted along with the X-shaped hinges after connection, a locking mechanism is arranged on the support frame slideway limiting plate corresponding to the X-shaped hinge and the locking mechanism is arranged in a final position of a slideway on the support frame slideway limiting plate.

Abstract: A set of high level test logic is configured to include a set of insertion points. The high-level test logic can be controlled to insert test conditions into a data center configuration. It can also be configured to execute remediation actions that are to be taken, and validation actions to be performed in order to determine whether the remediation action works against the test conditions. Different instances of the high-level test logic can be configured for different environments and different test conditions.

Abstract: A set of high level test logic is configured to include a set of insertion points. The high-level test logic can be controlled to insert test conditions into a data center configuration. It can also be configured to execute remediation actions that are to be taken, and validation actions to be performed in order to determine whether the remediation action works against the test conditions. Different instances of the high-level test logic can be configured for different environments and different test conditions.

Abstract: A set of high level test logic is configured to include a set of insertion points. The high-level test logic can be controlled to insert test conditions into a data center configuration. It can also be configured to execute remediation actions that are to be taken, and validation actions to be performed in order to determine whether the remediation action works against the test conditions. Different instances of the high-level test logic can be configured for different environments and different test conditions.