Patents by Inventor Hongxi Geng

Hongxi Geng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8847615
    Abstract: A method, apparatus and system for integrated circuit testing, wherein a plural number of devices under test (DUTs) and a plural number of comparison apparatuses are placed on a common substrate. The DUTs all operate under the same input stimulation and each produce its own operation output. The outputs are compared by the comparison apparatuses to generate comparison characteristics which are used to filter-out the failed devices. This invention lowers the testing cost, shortens time to product mass-production, and lowers the miss rate of failed devices passed as good ones.
    Type: Grant
    Filed: March 19, 2010
    Date of Patent: September 30, 2014
    Assignee: Shanghai Xinhao (Bravechips) Micro Electronics Co. Ltd.
    Inventors: Kenneth ChengHao Lin, Hongxi Geng, Haoqi Ren, Bingchun Zhang, Changchun Zhen
  • Publication number: 20100237891
    Abstract: A method, apparatus and system for integrated circuit testing, wherein a plural number of devices under test (DUTs) and a plural number of comparison apparatuses are placed on a common substrate. The DUTs all operate under the same input stimulation and each produce its own operation output. The outputs are compared by the comparison apparatuses to generate comparison characteristics which are used to filter-out the failed devices. This invention lowers the testing cost, shortens time to product mass-production, and lowers the miss rate of failed devices passed as good ones.
    Type: Application
    Filed: March 19, 2010
    Publication date: September 23, 2010
    Inventors: Kenneth ChengHao Lin, Hongxi Geng, Haoqi Ren, Bingchun Zhang, Changchun Zhen