Patents by Inventor Hongze WU

Hongze WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for fuzz testing based on resource access feedback
    Patent number: 11868238
    Abstract: A method includes receiving a test input, obtaining a resource access feedback indicating an access for a resource based on the test input, selectively, based on the resource access feedback indicating whether a first-time accessed resource is accessed based on the test input, adding the test input to a test input queue, and performing a fuzz test based on the test input queue with the test input.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: January 9, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hongze Wu, Jianyun Qu
  • METHOD AND APPARATUS FOR FUZZ TESTING
    Publication number: 20210397543
    Abstract: The present disclosure relates to an apparatus and method for fuzz testing. The method includes receiving a test input, obtaining a resource access feedback indicating an access for a resource based on the test input, and determining whether to add the test input to a test input queue based on the resource access feedback.
    Type: Application
    Filed: June 2, 2021
    Publication date: December 23, 2021
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Hongze WU, Jianyun QU