Patents by Inventor Honjin En
Honjin En has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20120125680Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 ?m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: ApplicationFiled: January 25, 2012Publication date: May 24, 2012Applicant: IBIDEN CO., LTDInventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Patent number: 8148643Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 ?m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: GrantFiled: October 19, 2007Date of Patent: April 3, 2012Assignee: IBIDEN Co., Ltd.Inventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Patent number: 7847318Abstract: Mesh holes 35a and 59a of upper solid layers 35 and upper solid layers 59 are formed to overlie on one another, so that the insulating properties of interlayer resin insulating layers 50 are not lowered. Here, the diameter of each mesh hole is preferably 75 to 300 ?m. The reason is as follows. If the diameter of the mesh hole is less than 75 ?m, it is difficult to overlay the upper and lower mesh holes on one another. If the diameter exceeds 300 ?m, the insulating properties of the interlayer resin insulating layers deteriorate. In addition, the distance between the mesh holes is preferably 100 to 2000 ?m. The reason is as follows. If the distance is less than 100 ?m, the solid layer cannot function. If the distance exceeds 2000 ?m, the deterioration of the insulating properties of the interlayer resin insulating film occurs.Type: GrantFiled: March 17, 2009Date of Patent: December 7, 2010Assignee: IBIDEN Co., Ltd.Inventors: Naohiro Hirose, Honjin En
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Patent number: 7832098Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 ?m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: GrantFiled: April 7, 2008Date of Patent: November 16, 2010Assignee: IBIDEN Co., Ltd.Inventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Publication number: 20090173523Abstract: Mesh holes 35a and 59a of upper solid layers 35 and upper solid layers 59 are formed to overlie on one another, so that the insulating properties of interlayer resin insulating layers 50 are not lowered. Here, the diameter of each mesh hole is preferably 75 to 300 ?m. The reason is as follows. If the diameter of the mesh hole is less than 75 ?m, it is difficult to overlay the upper and lower mesh holes on one another. If the diameter exceeds 300 ?m, the insulating properties of the interlayer resin insulating layers deteriorate. In addition, the distance between the mesh holes is preferably 100 to 2000 ?m. The reason is as follows. If the distance is less than 100 ?m, the solid layer cannot function. If the distance exceeds 2000 ?m, the deterioration of the insulating properties of the interlayer resin insulating film occurs.Type: ApplicationFiled: March 17, 2009Publication date: July 9, 2009Applicant: IBIDEN CO., LTDInventors: Naohiro HIROSE, Honjin En
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Patent number: 7514779Abstract: Mesh holes 35a and 59a of upper solid layers 35 and upper solid layers 59 are formed to overlie on one another, so that the insulating properties of interlayer resin insulating layers 50 are not lowered. Here, the diameter of each mesh hole is preferably 75 to 300 ?m. The reason is as follows. If the diameter of the mesh hole is less than 75 ?m, it is difficult to overlay the upper and lower mesh holes on one another. If the diameter exceeds 300 ?m, the insulating properties of the interlayer resin insulating layers deteriorate. In addition, the distance between the mesh holes is preferably 100 to 2000 ?m. The reason is as follows. If the distance is less than 100 ?m, the solid layer cannot function. If the distance exceeds 2000 ?m, the deterioration of the insulating properties of the interlayer resin insulating film occurs.Type: GrantFiled: December 31, 2002Date of Patent: April 7, 2009Assignee: Ibiden Co., Ltd.Inventors: Naohiro Hirose, Honjin En
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Patent number: 7415761Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 ?m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: GrantFiled: February 3, 2003Date of Patent: August 26, 2008Assignee: IBIDEN Co., Ltd.Inventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Publication number: 20080189943Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 ?m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: ApplicationFiled: April 7, 2008Publication date: August 14, 2008Applicant: IBIDEN CO., LTD.Inventors: Naohiro HIROSE, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Publication number: 20080173473Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 ?m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: ApplicationFiled: October 19, 2007Publication date: July 24, 2008Applicant: IBIDEN CO., LTDInventors: Naohiro HIROSE, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Publication number: 20040025333Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 &mgr;m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: ApplicationFiled: February 3, 2003Publication date: February 12, 2004Applicant: IBIDEN Co., Ltd.Inventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Patent number: 6613986Abstract: Mesh holes 35a and 59a of upper solid layers 35 and upper solid layers 59 are formed to overlie on one another, so that the insulating properties of interlayer resin insulating layers 50 are not lowered. Here, the diameter of each mesh hole is preferably 75 to 300 &mgr;m. The reason is as follows. If the diameter of the mesh hole is less than 75 &mgr;m, it is difficult to overlay the upper and lower mesh holes on one another. If the diameter exceeds 300 &mgr;m, the insulating properties of the interlayer resin insulating layers deteriorate. In addition, the distance between the mesh holes is preferably 100 to 2000 &mgr;m. The reason is as follows. If the distance is less than 100 &mgr;m, the solid layer cannot function. If the distance exceeds 2000 &mgr;m, the deterioration of the insulating properties of the interlayer resin insulating film occurs.Type: GrantFiled: May 17, 2001Date of Patent: September 2, 2003Assignee: Ibiden Co., Ltd.Inventors: Naohiro Hirose, Honjin En
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Patent number: 6591495Abstract: An opening is formed in resin by a laser beam so that a via hole is formed. Copper foil, the thickness of which is reduced to 3 &mgr;m by etching to lower the thermal conductivity, is used as a conformal mask. Therefore, an opening is formed in the resin and the number of irradiation of pulse-shape laser beam is reduced. Thus, occurence of undercut of the resin, which forms an interlayer insulating resin layer, can be prevented and the reliability of the connection of the via holes can be improved.Type: GrantFiled: March 5, 2001Date of Patent: July 15, 2003Assignee: IBIDEN Co., Ltd.Inventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda
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Publication number: 20030102151Abstract: Mesh holes 35a and 59a of upper solid layers 35 and upper solid layers 59 are formed to overlie on one another, so that the insulating properties of interlayer resin insulating layers 50 are not lowered. Here, the diameter of each mesh hole is preferably 75 to 300 &mgr;m. The reason is as follows. If the diameter of the mesh hole is less than 75 &mgr;m, it is difficult to overlay the upper and lower mesh holes on one another. If the diameter exceeds 300 &mgr;m, the insulating properties of the interlayer resin insulating layers deteriorate. In addition, the distance between the mesh holes is preferably 100 to 2000 &mgr;m. The reason is as follows. If the distance is less than 100 &mgr;m, the solid layer cannot function. If the distance exceeds 2000 &mgr;m, the deterioration of the insulating properties of the interlayer resin insulating film occurs.Type: ApplicationFiled: December 31, 2002Publication date: June 5, 2003Inventors: Naohiro Hirose, Honjin En
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Publication number: 20010042637Abstract: An opening is formed in resin 20 by a laser beam so that a via hole is formed. At this time, copper foil 22, the thickness of which is reduced (to 3 &mgr;m) by performing etching to lower the thermal conductivity is used as a conformal mask. Therefore, an opening 20a can be formed in the resin 20 if the number of irradiation of pulse-shape laser beam is reduced. Therefore, occurrence of undercut of the resin 20 which forms an interlayer insulating resin layer can be prevented. Thus, the reliability of the connection of the via holes can be improved.Type: ApplicationFiled: March 5, 2001Publication date: November 22, 2001Inventors: Naohiro Hirose, Kouta Noda, Hiroshi Segawa, Honjin En, Kiyotaka Tsukada, Naoto Ishida, Kouji Asano, Atsushi Shouda