Patents by Inventor Hoon Byun

Hoon Byun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250013341
    Abstract: Systems and methods for detecting and quantifying images are disclosed. Systems and methods can include a metrology platform comprising: a customizable or user-configurable pipeline that is configured to enable a user to automatically and longitudinally obtain a plurality of metrology metrics from a process environment; and a graphical user interface (GUI) for implementing the pipeline, wherein the GUI comprises (1) a plurality of graphical functions configured to permit the user to interact with or to customize the pipeline and (2) one or more visual display areas configured to display the plurality of metrology metrics and a set of metrology images associated thereof.
    Type: Application
    Filed: June 27, 2024
    Publication date: January 9, 2025
    Inventors: Yonghyun Kim, Ilkoo Kim, Hoon Byun, Wonhui Park, Sang-gil Park