Abstract: A one-time programmable (OTP) memory device includes an OTP memory cell array comprising a plurality of dummy cells and a plurality of main cell groups of main cells and an access circuit configured to write data to at least two of the cells simultaneously. The arrangement of the dummy cells and the main cell groups may allow for the reliable writing of multi-bit data to the memory array. Each of the main cell groups may include a plurality of main cells which are connected to word lines, respectively, and to bit lines, respectively. Each of the main cells may be writable and each of the dummy cells may be unwritable. Each of the main cells may include a contact layer, and the dummy cells might not include the contact layer. A supply voltage may be applied to the OTP memory cell array through the contact layer.

Abstract: A one-time programmable (OTP) memory device includes an OTP memory cell array comprising a plurality of dummy cells and a plurality of main cell groups of main cells and an access circuit configured to write data to at least two of the cells simultaneously. The arrangement of the dummy cells and the main cell groups may allow for the reliable writing of multi-bit data to the memory array. Each of the main cell groups may include a plurality of main cells which are connected to word lines, respectively, and to bit lines, respectively. Each of the main cells may be writable and each of the dummy cells may be unwritable. Each of the main cells may include a contact layer, and the dummy cells might not include the contact layer. A supply voltage may be applied to the OTP memory cell array through the contact layer.

Abstract: Provided is a programmable circuit. The programmable circuit includes a first path and a second path connected in parallel between a first voltage node and a second voltage node. The first path includes a first programmable element, a first node, a first pull-up transistor, a second node, and a first pull-down transistor connected in series between the first voltage node and the second voltage node. The second path includes a second programmable element, a third node, a second pull-up transistor, a fourth node, and a second pull-down transistor connected in series between the first and second voltage nodes. A gate electrode of the first pull-up transistor, a gate electrode of the first pull-down transistor, and the fourth node are electrically connected to one another. A gate electrode of the second pull-up transistor, a gate electrode of the second pull-down transistor, and the second node are electrically connected to one another.

Abstract: Provided is a programmable circuit. The programmable circuit includes a first path and a second path connected in parallel between a first voltage node and a second voltage node. The first path includes a first programmable element, a first node, a first pull-up transistor, a second node, and a first pull-down transistor connected in series between the first voltage node and the second voltage node. The second path includes a second programmable element, a third node, a second pull-up transistor, a fourth node, and a second pull-down transistor connected in series between the first and second voltage nodes. A gate electrode of the first pull-up transistor, a gate electrode of the first pull-down transistor, and the fourth node are electrically connected to one another. A gate electrode of the second pull-up transistor, a gate electrode of the second pull-down transistor, and the second node are electrically connected to one another.

Abstract: A voltage generator and methods thereof are provided. The example voltage generator may include a voltage comparison block which generates an output voltage in response to a read command, the output voltage corresponding to a difference between a reference voltage and a determination voltage and a voltage generation block which outputs the determination voltage and a comparison voltage in response to the read command, an inverse read command having a phase opposite that of the read command, a switching pulse signal and the output voltage. A first example method may include outputting a determination voltage and a comparison voltage in response to a read command, an inverse read command having a phase opposite that of the read command, a switching pulse signal and an output voltage, the output voltage generated in response to the read command and corresponding to a difference between the reference voltage and the determination voltage.

Abstract: A word line driving circuit includes a read voltage generator and a word line driver. The read voltage generator precharges a clamp capacitor with a power supply voltage to stably generate a read voltage in response to a read command. A capacitance of the clamp capacitor is varied to compensate for a fluctuation of a power supply voltage level. The word line driver distributes electric charges precharged in the clamp capacitor to a word line in response to a word line selecting signal. Therefore, the word line driving circuit reduces unnecessary power consumption in a standby mode by operating the word line rapidly with charge sharing in a read mode.

Abstract: A word line driving circuit may include a first word line driver, a second word line driver and a pass transistor. In response to a word line selecting signal, the first word line driver may drive a word line using a first word line driving voltage signal in a first operation mode or the second word line driver may drive the word line using a second word line driving voltage signal. The pass transistor coupled between the first word line driver and the word line may transmit the first word line driving voltage signal to the word line in response to a control voltage signal, which is self-boosted at an initial stage of the first operation mode and is maintained at a stable voltage level after a time period.

Abstract: A flash cell fuse circuit includes a fuse cell array, a plurality of switch circuits and a plurality of fuse sense amplifiers. The fuse cell array outputs first signals in response to word line enable signals after a program or erase operation. The switch circuits pass one of the first signals in response to a reset signal and one of the word line enable signals. The fuse sense amplifiers each generate a fuse signal by detecting and amplifying an output signal of a corresponding switch circuit.

Abstract: A voltage generator and methods thereof are provided. The example voltage generator may include a voltage comparison block which generates an output voltage in response to a read command, the output voltage corresponding to a difference between a reference voltage and a determination voltage and a voltage generation block which outputs the determination voltage and a comparison voltage in response to the read command, an inverse read command having a phase opposite that of the read command, a switching pulse signal and the output voltage. A first example method may include outputting a determination voltage and a comparison voltage in response to a read command, an inverse read command having a phase opposite that of the read command, a switching pulse signal and an output voltage, the output voltage generated in response to the read command and corresponding to a difference between the reference voltage and the determination voltage.

Abstract: A word line driving circuit may include a first word line driver, a second word line driver and a pass transistor. In response to a word line selecting signal, the first word line driver may drive a word line using a first word line driving voltage signal in a first operation mode or the second word line driver may drive the word line using a second word line driving voltage signal. The pass transistor coupled between the first word line driver and the word line may transmit the first word line driving voltage signal to the word line in response to a control voltage signal, which is self-boosted at an initial stage of the first operation mode and is maintained at a stable voltage level after a time period.

Abstract: A word line driving circuit, which may include a read voltage generator and a word line driver. The read voltage generator may precharge a clamp capacitor with a power supply voltage to stably generate a read voltage in response to a read command. A capacitance of the clamp capacitor may be varied to compensate for a fluctuation of a power supply voltage level. The word line driver may distribute electric charges precharged in the clamp capacitor to a word line in response to a word line selecting signal. Therefore, the word line driving circuit may reduce unnecessary power consumption in a standby mode by operating the word line rapidly with charge sharing in a read mode.

Abstract: A flash cell fuse circuit includes a fuse cell array, a plurality of switch circuits and a plurality of fuse sense amplifiers. The fuse cell array outputs first signals in response to word line enable signals after a program or erase operation. The switch circuits pass one of the first signals in response to a reset signal and one of the word line enable signals. The fuse sense amplifiers each generate a fuse signal by detecting and amplifying an output signal of a corresponding switch circuit.