Patents by Inventor Hooshmand Mahmood Kalayeh

Hooshmand Mahmood Kalayeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7333184
    Abstract: A method for improving the accuracy of estimating concentration path length of a target molecule using a differential absorption LIDAR (DIAL) system. In particular, this method allows improved detection of plumes containing the target molecule against inhomogeneous background, such as uncovered ground or ground with various types of cover. In an embodiment of the present invention, spectral surface reflectivity variations are systematically corrected based on interpolation of surface reflectivity measurements of multiple offline beams of different wavelengths, which are relatively close to the online wavelength. In another embodiment, the signal to noise ratio of the received online pulse energy is improved by using multiple laser beams having the online wavelength and the signal to noise ratio of the received pulse energies at an offline wavelength is improved by using multiple laser beams having that offline wavelength.
    Type: Grant
    Filed: July 1, 2005
    Date of Patent: February 19, 2008
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventor: Hooshmand Mahmood Kalayeh
  • Patent number: 7260507
    Abstract: An improved method for determining whether a measurement point, measured using a differential absorption LIDAR (DIAL) system, represents a plume point or a non-plume point. Concentration path lengths (CPL's) for a plurality of measurement points are determined. An average non-plume CPL, CPL, is provided. For each measurement point, a standard deviation, CPLsd, is calculated based on first order error propagation and it is determined that the measurement point represents a non-plume point when the Hooshmand decision rule (HDR) is met. The HDR is given by, ( cpl - CPL _ CPL sd ) 2 > ( T ) 2 , where cpl is the corresponding CPL of the measurement point being tested and T is a threshold standard deviation level.
    Type: Grant
    Filed: September 9, 2005
    Date of Patent: August 21, 2007
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventor: Hooshmand Mahmood Kalayeh