Patents by Inventor Horng Y. Wen

Horng Y. Wen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measurement of impurities in liquids
    Patent number: 4794086
    Abstract: Method and apparatus for the measurement of sub-ppm concentrations of impurities in liquids. The liquid to be measured for impurities is dispersed into uniform droplets of a precisely known diameter D in a gas stream, such as air, using for example, a vibratory orifice generator. The dispersed droplets evaporate in the gas stream to leave a residue particle having a diameter d, which can be measured for example by means of a laser light scattering spectrometer. The concentration by volume, C.sub.v, of the impurities can then be calculated according to the equation; C.sub.v =(d/D).sup.3.
    Type: Grant
    Filed: November 25, 1985
    Date of Patent: December 27, 1988
    Assignee: Liquid Air Corporation
    Inventors: Gerhard Kasper, Horng Y. Wen