Abstract: The invention relates to a method for exposure control which is intended notably for dynamic X-ray examinations of an object involving a varying X-ray absorption as well as to an X-ray generator which includes an automatic exposure control unit for carrying out such a method. The method and the device are characterized notably in that an exposure kV start voltage and a maximum exposure time Tmax (for example, 100 ms) can be defined; in order to avoid motional unsharpness in the image, these variables may not be exceeded.

Abstract: The invention relates to a method for exposure control which is intended notably for dynamic X-ray examinations of an object involving a varying X-ray absorption as well as to an X-ray generator which includes an automatic exposure control unit for carrying out such a method. The method and the device are characterized notably in that an exposure kV start voltage and a maximum exposure time Tmax (for example, 100 ms) can be defined; in order to avoid motional unsharpness in the image, these variables may not be exceeded.

Abstract: The invention relates to an X-ray device which includes a primary diaphragm device (3) for limiting the X-ray beam and a control circuit (10) for automatic exposure control, which control circuit includes a detector (9) with at least one measuring field (31) which measures the X-ray dose rate. Whereas in the case of customary exposure control systems the X-ray dose is increased when the radiation beam is strongly limited so that parts of the measuring field (31) are not exposed, which could lead to overexposed X-ray images, the X-ray device according to the invention is provided with means (12, 14, 15, 16, 17) for determining a correction value (K) which is dependent on the dimensions of the exposed area (33) of the measuring field (31) and acts on the control circuit (10) in such a manner that an increase of the X-ray dose is even avoided in the case of a partly non-exposed measuring field (31).