Abstract: A device (100) for the quality analysis of system models (10, 12) has a testing tool (1) that is designed to receive a plurality of system models (10, 12) from a plurality of modeling tools (11, 13), convert it into a unified data model (2) and check it for quality with the aid of unified quality rules (3).

Abstract: A device (100) for the quality analysis of system models (10, 12) has a testing tool (1) that is designed to receive a plurality of system models (10, 12) from a plurality of modeling tools (11, 13), convert it into a unified data model (2) and check it for quality with the aid of unified quality rules (3).

Abstract: A method and a device are disclosed for automated evaluation of the quality of a software source code, a quality target being predetermined for the quality of the source code. The current quality of the source code and the distance between the current quality of the source code and the predetermined quality target are determined for the quality of the source code. At least one embodiment of the invention permits high volumes of source code to be evaluated in an automated fashion with respect to their quality.

Abstract: A method and a device are disclosed for automated evaluation of the quality of a software source code, a quality target being predetermined for the quality of the source code. The current quality of the source code and the distance between the current quality of the source code and the predetermined quality target are determined for the quality of the source code. At least one embodiment of the invention permits high volumes of source code to be evaluated in an automated fashion with respect to their quality.

Abstract: Memory modules contain most of the transistors in a computer and thus constitute the most important components to be tested. In order, for example, to monitor the function of memory chips in applications which are critical for safety, it is necessary to carry out memory tests during ongoing operation of a computer. Furthermore, it is appropriate to make these memory tests possible under real-time conditions so that the application program can run without degradation. Highly effective memory tests enable stuck-at faults, connection faults and pattern-sensitive faults to be detected. In the method, the highly effective memory test is performed during ongoing operation of a computer while maintaining real-time conditions by dividing testing into a suitable combination of Franklin tests, which discover pattern-sensitive faults of adjacent memory cells, and of Nair tests, which discover connection faults in the incoming lines.