Patents by Inventor Horst R. Niehaus

Horst R. Niehaus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tester architecture for testing semiconductor integrated circuits
    Patent number: 6956394
    Abstract: A modular tester architecture allows end-users to mix-and-match scan chain modules and clock driver modules. Modules are interconnected via a synchronization bus allowing the test modules to synchronize with each other so that each can perform its portion of the overall test at the proper time in relation to the testing performed by other modules. The modules can include a BIST driver module, a data acquisition module, networking interface modules, a controller module, a current measurement module, and a DC parametrics module, among others.
    Type: Grant
    Filed: May 21, 2004
    Date of Patent: October 18, 2005
    Assignee: Teseda Corporation
    Inventors: Ajit M. Limaye, Peter H. Decher, Horst R. Niehaus
  • Tester architecture for testing semiconductor integrated circuits
    Publication number: 20040232936
    Abstract: A modular tester architecture allows end-users to mix-and-match scan chain modules and clock driver modules. Modules are interconnected via a synchronization bus allowing the test modules to synchronize with each other so that each can perform its portion of the overall test at the proper time in relation to the testing performed by other modules. The modules can include a BIST driver module, a data acquisition module, networking interface modules, a controller module, a current measurement module, and a DC parametrics module, among others.
    Type: Application
    Filed: May 21, 2004
    Publication date: November 25, 2004
    Applicant: Teseda Corporation
    Inventors: Ajit M. Limaye, Peter H. Decher, Horst R. Niehaus