Abstract: Technologies and techniques for monitoring the reliability of an electronic system having one or more electronic components. A transmission quality of signals transmitted to or from the electronic system over a wired electrical signal transmission path are measured at different measurement times and according to a predetermined transmission quality measure. For each of the measurement times, the associated measured transmission quality is compared with a respective associated transmission quality reference value previously determined according to the transmission quality measure. A value of a reliability indicator associated with the respective measurement time is determined in dependence on the result of the associated comparison.

Abstract: An integrated circuit is provided that comprise a receive unit to be tested for receiving an input signal and storing the input signal at a predetermined point of time. Additionally, it comprises a processor for applying an error correction to the received input signal, for comparing the error corrected signal with an expectation value and for outputting an error message when the filtered input signal does not correspond to the expectation value. A power source supplies the receive unit to be tested with an adjustable voltage and/or and adjustable current. An adjustment unit varies the predetermined point in time and the adjustable voltage respectively the adjustable current.

Abstract: An integrated circuit is provided that comprise a receive unit to be tested for receiving an input signal and storing the input signal at a predetermined point of time. Additionally, it comprises a processor for applying an error correction to the received input signal, for comparing the error corrected signal with an expectation value and for outputting an error message when the filtered input signal does not correspond to the expectation value. A power source supplies the receive unit to be tested with an adjustable voltage and/or and adjustable current. An adjustment unit varies the predetermined point in time and the adjustable voltage respectively the adjustable current.

Abstract: The invention relates to an electronic component comprising a first integrated sub-circuit having a defined interface and a defined fixed-hardware functionality, a second, reconfigurable integrated sub-circuit being signal-connected via the interface to the first sub-circuit to exchange signals therewith, and optionally supply energy thereto, and one or more terminals for electrically connecting the electronic component to its periphery. The second sub-circuit is configured as an interface circuit between the one or more terminals and the first sub-circuit. The second sub-circuit is further configured as a reconfigurable integrated testing unit to test said hardware functionality of the first sub-circuit by applying one or more input signals to the first circuit and evaluating one or more output signals received via the interface from the first sub-circuit in response to the one or more input signals for conformance with one or more predetermined test criteria.

Abstract: A system-on-chip comprises: a first sub-circuit having a defined interface and a defined fixed-hardware functionality; a second reconfigurable sub-circuit being signal-connected via the interface to the first sub-circuit; and one or more terminals. The second sub-circuit is configured as an interface circuit between the terminals and the first sub-circuit. The first sub-circuit and the second sub-circuit are split into a plurality of individual first and second circuit blocks. At least one of said first circuit blocks is signal-connected via signal connections, each running through one or more of the second circuit blocks, to one or more other first circuit blocks or one or more of the terminals. One or more of said signal connections are reconfigurable, by the respective one or more second circuit blocks pertaining to the respective signal connection. The SOC is reconfigurable before or during its operation by reconfiguring at least one of said second circuit blocks.

Abstract: The invention relates to a method as well as an apparatus configured for its execution for monitoring the reliability of an electronic system, in particular an electronic system comprising one or more electronic components.