Abstract: A food processor includes a main machine, a processing cup structure, and a heating device. The main machine has a processing chamber with an opening at an upper end of the processing chamber. The processing cup structure includes a processing cup, at least part of the processing cup is configured to be detachably mounted in the processing chamber through the opening of the processing chamber, and a processing cavity is formed in the processing cup for containing food material. The heating device is provided in the main machine, and is configured to heat heat-conducting fluid in the processing chamber. The heated heat-conducting fluid conducts heat into the processing cavity, to at least heat the food material in the processing cavity.

Abstract: A method and system for adjusting traffic lights. The method and system can dynamically divide a region according to the road congestion situation and adjust traffic lights in a resulting control region according to the control region, so as to solve the traffic congestion problem. The system for adjusting traffic lights includes: a congestion determining module, a control region determining module and a adjusting module, wherein the control region determining module is configured to determine a control region according to a dispersion demand of a first phase and a dispersal capability of a corresponding phase of an adjacent intersection, and the adjusting module is configured to adjust traffic lights of at least one corresponding phase of an adjacent intersection in the control region so as to relieve the traffic congestion situation at the first phase of the first intersection. Also described is a corresponding method for adjusting traffic lights.

Abstract: Traffic information processing method and apparatus. The method includes the steps of: obtaining road traffic data of a plurality of road sections; predicting for at least two road sections of the plurality of road sections, based on the obtained data, traffic flow information at an expected time when arriving at the road section from a current position, the traffic flow information being used for describing a traffic state of a road; displaying via a display apparatus the predicted traffic flow information of at least two road sections in the at least two road sections. In addition, the present invention provides a traffic information processing apparatus, a GPS navigation device, and a variable message board. By applying the technical solution provided in the present invention, the road traffic condition can be effectively transferred to users so that it is convenient for the users to plan routes for their travel.

Abstract: The single-step debug card using the PCI interface according to the present invention utilizes a bus master to send out an REQ# signal to request issuing a control during the PCI bus cycle to be inspected. The address, data, command, and byte enable (BE#) of the bus cycle are locked and displayed through LEDs for single-step debugging. Through a switch circuit, a TRDY# ready signal is sent out. A device selection signal (DEVSEL#) is raised to HIGH at the same time the TRDY# ready signal finishes so as to notify the bus master on the single-step interruption debug card to end the cycle for single-step debugging.

Abstract: This specification discloses a single step debug card using the PCI bus, which keeps the FRAME# of the PCI bus at a low voltage; latches and displays through an LED the address and command of the PCI bus cycle; keeps the control signal of read only memory and the IRDY# ready signal and TRDY# ready signal on the PCI bus at a low voltage, latches and displays through an LED the data and byte enable of the PCI bus cycle; outputs a device selection signal from a target device when the target device is detected; intercepts the PCI bus cycle when the device selection signal is kept at a low voltage and both the IRDY# ready signal and the TRDY# ready signal are kept at a low voltage; enables the PCI host to provide a retry function when the target device cannot respond a TRDY# ready signal before the PCI bus cycle ends so as to achieve the function of single step interruption debugging.

Abstract: The single-step debug card using the PCI interface according to the present invention utilizes a bus master to send out an REQ# signal to request issuing a control during the PCI bus cycle to be inspected. The address, data, command, and byte enable (BE#) of the bus cycle are locked and displayed through LEDs for single-step debugging. Through a switch circuit, a TRDY# ready signal is sent out. A device selection signal (DEVSEL#) is raised to HIGH at the same time the TRDY# ready signal finishes so as to notify the bus master on the single-step interruption debug card to end the cycle for single-step debugging.

Abstract: This specification discloses a single step debug card using the PCI bus, which keeps the FRAME# of the PCI bus at a low voltage; latches and displays through an LED the address and command of the PCI bus cycle; keeps the control signal of read only memory and the IRDY# ready signal and TRDY# ready signal on the PCI bus at a low voltage, latches and displays through an LED the data and byte enable of the PCI bus cycle; outputs a device selection signal from a target device when the target device is detected; intercepts the PCI bus cycle when the device selection signal is kept at a low voltage and both the IRDY# ready signal and the TRDY# ready signal are kept at a low voltage; enables the PCI host to provide a retry function when the target device cannot respond a TRDY# ready signal before the PCI bus cycle ends so as to achieve the function of single step interruption debugging.

Abstract: A method for forming a patterned photoresist layer. There is first provided a substrate. There is then formed over the substrate a blanket photoresist layer. The blanket photoresist layer is then implanted with a first ion beam to form an ion implanted blanket photoresist layer. The first ion beam employs a first ion having a first energy and a first dose sufficient such that an ion implanted patterned photoresist layer formed from the ion implanted blanket photoresist layer will not substantially outgas when the ion implanted patterned photoresist layer is exposed to a second beam. The ion implanted blanket photoresist layer is then patterned to form the ion implanted patterned photoresist layer. The method may be employed in selective high energy beam processing of the substrate. The method is particularly suited to selective high energy ion implant processing of semiconductor substrates employed within integrated circuit microelectronics fabrications.