Patents by Inventor Houng-Jie Chang

Houng-Jie Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting defect of semiconductor device
    Patent number: 6806104
    Abstract: A method for detecting defects of a semiconductor device is provided. The semiconductor device comprises at least a substrate, a gate, a source region, a drain region, a plug, an insulating layer, and a conducting line. The plug electrically connects the source region or the drain region and is above a portion of the gate. At least a defect exists between the plug and the gate. The method comprises: polishing the semiconductor device until the plug above the gate is removed; cleaning the semiconductor device; removing the insulating layer between the gate and the plug; and detecting the defect between the plug and the gate.
    Type: Grant
    Filed: September 25, 2003
    Date of Patent: October 19, 2004
    Assignee: Powerchip Semiconductor Corp.
    Inventors: Houng-Jie Chang, Sheng-Ju Chang