Patents by Inventor Houping WU

Houping WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240402318
    Abstract: A calibration module and a use method therefor. The calibration module comprises: a plurality of observation planes, wherein among the plurality of observation planes, planes where at least two observation planes are located intersect, and there is a determined spatial position relationship between the plurality of observation planes. Each observation plane is provided with an observation area, and each observation area is provided with a corresponding calibrated BRDF value. By means of providing a polyhedral calibration module, the accuracy of measurement of the attitude of the calibration module and the incident angle of a light source is improved, such that the accuracy of testing of a BRDF characteristic of a surface of an object to be tested is improved.
    Type: Application
    Filed: September 28, 2022
    Publication date: December 5, 2024
    Inventors: Yingwei HE, Haiyong GAN, Houping WU, Yingce WANG, Chundi ZHENG, Guojin FENG
  • Publication number: 20240319335
    Abstract: A scaling module, and a calibration method and use method therefore, relating to the technical field of reflection detection. The scaling module comprises a three-dimensional scaler (1); the three-dimensional scaler (1) comprises a microwave reflective layer (11) and an optical reflective layer (12); the microwave reflective layer (11) has a first scaling surface, and the optical reflective layer (12) has a second scaling surface; the first scaling surface is divided into a plurality of first scaling areas, the plurality of second scaling surfaces are divided into a plurality of second scaling areas, and the plurality of first scaling areas and the plurality of second scaling areas are arranged in a one-to-one correspondence manner; the microwave reflective layer (11) is used for reflecting microwaves emitted by a synthetic aperture radar, and the optical reflective layer (12) is used for reflecting light to an optical imaging device.
    Type: Application
    Filed: June 4, 2024
    Publication date: September 26, 2024
    Applicant: National Institute of Metrology
    Inventors: Haiyong GAN, Yingwei HE, Houping WU, Yingce WANG, Donglin MENG, Hao XU, Xiao LIU