Abstract: A system, apparatus and/or method for detecting and analyzing light intensities of reflected light from a surface of /a specimen, preferably a web, wherein light is directed onto the surface of the specimen, light reflected from the surface is detected by an array of photosensitive elements, and a signal generated by the array is analyzed to identify reflected light intensities that exceed at least one threshold for a sufficient number of photosensitive elements to warrant classification as indicative of a sufficiently pronounced change in the angularity or reflectance in the surface of the specimen. In particular, the pronounced change can be identified as a defect, for example, a crease, in the specimen surface. Preferably, the array is a CCD array. Preferably, the specimen is a video tape.

Abstract: A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge defects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.

Abstract: A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge deflects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.

Abstract: A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge defects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.

Abstract: A film flaw detection system has capacitive sensing members for sensing capacitance changes in correspondence with irregular film variations. The sensing members take two forms. One form senses variation in film thickness by using the film as a dielectric between two plates of the capacitor. Changes in film thickness result in changes in the dielectric and hence in the capacitance. The other form consists of feelers which ride along the surface of the film and which move transversely to the film movement in response to flaws in the film. Each feeler forms a plate of a capacitance, and movement of the feeler changes the distance between this plate and an associated fixed plate which results in a capacitance change. The detecting circuit comprises a phase detection system for measuring phase changes in a high frequency signal. These phase changes correspond to capacitance changes caused by flaws in the film and sensed by either of the two forms of sensing means.

Abstract: A film detector system is provided for detecting film splices or other surface abnormalities longer than a desired length. A film support member is provided over which a strip of film travels which is to be analyzed. First and second light beams are projected parallel with the film surface across the film such that thickness increases due to surface abnormalities on the film intercept portions of the light beam. As a result a shadow is cast on first and second light detectors. The first and second light beams are spaced from one another such that when a film splice or other abnormality intercepts one of the light beams, the other light beam is not simultaneously intercepted if the film splice or abnormality is of normal length but will be intercepted simultaneously if the film splice is of abnormal length. Outputs from the first and second light detectors are compared and the film travel is stopped when the signal is simultaneously received from each of the light detectors.

Abstract: An apparatus for ultra-sonically cleaning any information bearing material, web, sheet, fiche, film or similar strip material is operable in two modes. The first mode is directed to cleaning the film, and employs a pair of air nozzles for nonevaporatively stripping cleaning solvent from the surface of the film, after the film has been immersed in the solvent. The action of the air nozzles creates a mist of solvent about the nozzles, which is condensed by a plurality of cooling coils and collected, and circulates same through a purification system and returns the solvent to the cleaning tank for subsequent reuse in the film cleaning mode of operation. The air emerging from the nozzles is returned to the air compressor, thereby forming a closed loop compressor system which minimizes escape of solvent vapors into the atmosphere.

Abstract: A film thickness detector system has first and second thickness detector positions. The first position includes a light source for projecting a light beam to a light detector. A guide roller positions a film strip such that the light beam is tangent to a portion of the film strip supported by the guide roller. The film strip lies between the light source and light detector and the light beam is intercepted by a portion of the film strip at an angle with respect to the longitudinal axis of the film strip. As the thickness of the film strip intercepting a portion of the light beam varies, the output from the light detector varies in a corresponding manner. The output is amplified and may be used for stopping motion of the film. The second thickness detector position also has a light source and at least one light detector positioned to receive a light beam from the light source.

Abstract: A film inspection apparatus is provided for detecting changes in surface profile of film, e.g., edge breaks sprocket hole tears, poor splices, etc. The film inspection apparatus includes a device mounted above a sapphire film support and having a pair of cantilever jewel carrying members for feeling the surface profile adjacent each edge of a traveling web of film. Each cantilever includes a thin vane which extends into and modulates a respective light beam which is incident upon a respective photocell. Each photocell is connected to a separate channel of a braking circuit to operate a brake for the film driving mechanism when a surface profile is encountered which is to be considered as an unacceptable flaw.