Patents by Inventor Hrishikesh Bale

Hrishikesh Bale has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast
    Patent number: 11645792
    Abstract: An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.
    Type: Grant
    Filed: December 18, 2020
    Date of Patent: May 9, 2023
    Assignee: Carl Zeiss X-ray Microscopy, Inc.
    Inventors: Matthew Andrew, Lars Omlor, Hrishikesh Bale, Christoph Graf vom Hagen
  • Edge Phase Effects Removal Using Wavelet Correction and Particle Classification Using Combined Absorption and Phase Contrast
    Publication number: 20220366620
    Abstract: An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.
    Type: Application
    Filed: December 18, 2020
    Publication date: November 17, 2022
    Inventors: Matthew Andrew, Lars Omlar, Hrishikesh Bale, Christoph Graf vom Hagen
  • High-temperature strain cell for tomographic imaging
    Patent number: 9057681
    Abstract: This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.
    Type: Grant
    Filed: November 15, 2013
    Date of Patent: June 16, 2015
    Assignee: The Regents of the University of California
    Inventors: Alastair A. MacDowell, James Nasiatka, Abdel Haboub, Robert O. Ritchie, Hrishikesh A. Bale
  • HIGH-TEMPERATURE STRAIN CELL FOR TOMOGRAPHIC IMAGING
    Publication number: 20140161223
    Abstract: This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.
    Type: Application
    Filed: November 15, 2013
    Publication date: June 12, 2014
    Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
    Inventors: Alastair A. MacDowell, James Nasiatka, Abdel Haboub, Robert O. Ritchie, Hrishikesh A. Bale