Abstract: The present application discloses a calibration data generation circuit and an associated method. The calibration data generation circuit includes: a first delay unit, having a first delay amount; and a first scan path, including: a first scan flip-flop, including: a scan data input terminal; a clock input terminal, arranged for receiving a clock signal; and an output terminal; and a second scan flip-flop, including: a scan data input terminal, coupled to the output terminal of the first scan flip-flop; a clock input terminal, arranged for receiving a delayed clock signal formed by the clock signal passing through the first delay unit; and an output terminal; wherein when the calibration data generation circuit operates, the first scan flip-flop and the second scan flip-flop are configured in a scan shift mode.

Abstract: A detection circuit configured to detect whether timing violations occur in a target circuit. The target circuit is operated according a clock signal. The detection circuit includes a signal generation circuit, a first delay adjustable circuit, a second delay adjustable circuit, and a signal detector. The signal generation circuit is configured to generate a test signal. The first and second delay adjustable circuit are respectively configured to delay the test signal and clock signal to generate a first delay signal and a second delay signal according to the operating speed of the target circuit. The signal detector is configured to generate an indicating signal according to the first delay signal, the second delay signal, the test signal, and the clock signal. The indicating signal is configured to indicate whether an operating voltage of the target circuit causes a hold time violation of timing violations to occur in the target circuit.