Patents by Inventor Hsien-I You

Hsien-I You has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for whole field thin film stress evaluation
    Patent number: 7403270
    Abstract: A novel method for whole field thin film stress evaluation is provided. Through the provided method, the whole filed thin film stress distribution for an optical thin film would be developed with a commercial interferometer, so that a whole field evaluation for the crack or peel-off of thin film is hence achievable.
    Type: Grant
    Filed: May 9, 2006
    Date of Patent: July 22, 2008
    Assignee: Instrument Technology Research Center, National Applied Laboratories
    Inventors: Chi Hung Huang, Hsien-I You, Mao-Yuan Shih, Chien-Jen Chen
  • Method for whole field thin film stress evaluation
    Publication number: 20070017296
    Abstract: A novel method for whole field thin film stress evaluation is provided. Through the provided method, the whole filed thin film stress distribution for an optical thin film would be developed with a commercial interferometer, so that a whole field evaluation for the crack or peel-off of thin film is hence achievable.
    Type: Application
    Filed: May 9, 2006
    Publication date: January 25, 2007
    Applicant: Instrument Technology Research Center, National Applied Research Laboratories
    Inventors: Chi Huang, Hsien-I You, Mao-Yuan Shih, Chien-Jen Chen