Abstract: A die defect inspecting system with a die defect inspecting function includes a wafer-positioning module, an image-capturing module, a die-sucking module, a die defect analyzing module, a die-classifying module and a control module. The image-capturing module is disposed beside one side of the wafer-positioning module in order to capture an image of each die. The die-sucking module is disposed above the wafer-positioning module and the image-capturing module in order to suck each die from the wafer-positioning module to a position above the image-capturing module for capturing a back image of a back surface of each die. The die defect analyzing module is electrically connected to the image-capturing module in order to judge whether the back image of the back surface of each die passes inspection standard.

Abstract: The invention provides a method for data recording of an optical disk drive. First, raw data is encoded to obtain a plurality of recording units of encoded data to be stored in a memory. The encoded data stored in the memory is then recorded to an optical disk. A predetermined number of recording units of the encoded data is then reserved in the memory as reserved data without being recorded onto the optical disk. The recorded data read from the optical disk is then compared to the corresponding encoded data stored in the memory to verify correctness of the recorded data. The reserved data is then recorded to the optical disk after correctness verification of the recorded data is completed. Finally, the aforementioned steps are repeated until there is no more raw data left as a source for encoding.

Abstract: A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.

Abstract: A wafer testing method for wafer testing system comprises the steps: loading a wafer and then positioning the wafer relatively to a map file image stored in a map file. The map file is of a first file type. The next step is inspecting the appearance of the wafer. When the user detects defects on the wafer, the positions of the defects are directly recorded in the map file and then the modified map file is saved. The map file can be directly modified when the wafer is in the testing procedure so that the testing time is reduced. Furthermore, the precision of the testing is improved.

Abstract: A modulation method for symbols in a frame of a compact disc includes the steps of receiving a plurality of data words, modulating each data word into a code word of a corresponding data symbol, and providing a plurality of combinations of potential merge bits to be inserted between successive symbols of the frame. At least one combination of candidate merge bits is generated according to the plurality of combinations of potential merge bits, a data symbol immediately preceding the location of the candidate merge bits, and a data symbol immediately succeeding the location of the candidate merge bits. The combination of candidate merge bits which minimizes (optimizes) the absolute cumulative DSV is selected when a subsequent group of possible combinations of candidate merge bits is detected or after a predetermined delay, and the selected combination of candidate merge bits is inserted between the two successive data symbols.

Abstract: A modulation system includes an encoder for transferring data words to tentative code words. A DSV control bit generator determines the value of a DSV control bit according to the data words or the tentative code words to optimize the cumulative DSVs corresponding tentative code words, wherein the DSV control bit generator determines the value of a current DSV control bit when at least a subsequent DSV control bit is detected. A final code word generator generates final code words according to the determined DSV control bit and the tentative code words.

Abstract: A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.

Abstract: An EFM/EFM+ encoder and a method thereof, performing digital sum value (DSV) protection in an Eight-to-Fourteen/Eight-to-Fourteen Plus (EFM/EFM+) encoding system to generate a data frame to be recorded on a recording medium. The method comprises modulating source data to the data frame having a predetermined number of channel bits, determining merging bits and DSV based on the channel bits, and changing the predetermined number of the channel bits in the data frame based on the DSV and the merging bits. The changing the predetermined number of the channel bits comprises inserting or removing a channel bit at the end of the data frame.

Abstract: A system for recording a data on an optical storage medium comprises an apparatus. The apparatus includes an integrated circuit, a data buffer, and a microprocessor. The system separates data preparation operations and encoding operations so the recording performance is improved. A method for recording a data on an optical storage medium comprises the following steps: generating a set of data prepare batch values; providing a data prepare batch controller to generate a set of data prepare control signals in response to the set of data prepare batch values; and providing a data prepare circuit to prepare the data in response to the set of data prepare control signals.

Abstract: A modulation method for symbols in a frame of a compact disc includes the steps of receiving a plurality of data words, modulating each data word into a code word of a corresponding data symbol, and providing a plurality of combinations of potential merge bits to be inserted between successive symbols of the frame. At least one combination of candidate merge bits is generated according to the plurality of combinations of potential merge bits, a data symbol immediately preceding the location of the candidate merge bits, and a data symbol immediately succeeding the location of the candidate merge bits. The combination of candidate merge bits which minimizes (optimizes) the absolute cumulative DSV is selected when a subsequent group of possible combinations of candidate merge bits is detected or after a predetermined delay, and the selected combination of candidate merge bits is inserted between the two successive data symbols.

Abstract: A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.

Abstract: An information recording device and a related method are disclosed. The information recording device and the related method are capable of adjusting a phase error between a first synchronization signal and a second synchronization signal, where the first synchronization signal is synchronous to a location on a recording medium, the second synchronization signal is synchronous to a data pattern to be written onto the recording medium, and the data pattern comprise a sync pattern and a non-sync pattern. The information recording device includes a phase detector for detecting the phase error between the first synchronization signal and the second synchronization signal; and a controller, electrically connected to the phase detector, for adjusting the length of the non-sync pattern of the data pattern according to the phase error, thereby making the second synchronization signal substantially synchronized with the first synchronization signal.

Abstract: An information recording device and related method are disclosed. The information recording device is capable of adjusting a phase difference between a first synchronization signal and a second synchronization signal. The information recording device includes an encoder for generating a run-length of an encoded data; a phase detector for detecting the phase difference between the first and the second synchronous signals; a shift offset controller, electrically connected to the phase detector, for generating a shift information according to the phase difference; and a write pulse generator, electrically connected to the encoder and the shift offset controller, for generating a write pulse signal according to the run-length of the encoded data and the shift information, thereby making the first synchronous signal synchronized with the second synchronous signal.

Abstract: A method for controlling an optical disc drive to resume interrupted recording on an optical disc includes: when the recording of a first recording unit block (RUB) is interrupted, storing an address thereof and storing a first value corresponding to the number of recorded sets of data of the first RUB; according to the address, searching a pseudo-recording start position corresponding to a recorded set of data of a specific RUB which is the first RUB or a second RUB recorded on the optical disc prior to the first RUB; re-encoding at least a portion of raw data corresponding to recorded sets of data on the optical disc and performing pseudo-recording from the pseudo-recording start position without physically writing on the optical disc until a second value matches a target value; and physically writing on the optical disc when the second value matches the target value to resume recording.

Abstract: A method and device for error analysis particularly adoptable for a recording medium such as an optical disc are disclosed. The present invention executes an encoding-like operation such as an interleaving operation to error flags during reproducing data from the optical disc, so as to obtain number and distribution of the errors on the disc.

Abstract: A modulation system includes an encoder for transferring data words to tentative code words. A DSV control bit generator determines the value of a DSV control bit according to the data words or the tentative code words to optimize the cumulative DSVs corresponding tentative code words, wherein the DSV control bit generator determines the value of a current DSV control bit when at least a subsequent DSV control bit is detected. A final code word generator generates final code words according to the determined DSV control bit and the tentative code words.

Abstract: In a high-density optical storage system, data words are modulated into code words in a manner of minimizing the fluctuation of the digital sum value (DSV). A cumulative DSV is calculated for each possible value of a DSV control bit. The DSV control bit is determined to minimize the absolute cumulative DSV when detecting at least one subsequent DSV control bit or after a predetermined delay. A corresponding code word is generated according to the determined current DSV control bit.

Abstract: An infrared photodetector structure with voltage-tunable and -switchable photoresponses constructed of superlattices and blocking barriers. The photoresponses of the double-superlattice structure are also insensitive to the operating temperature changes. By using GaAs/AlxGa1-xAs system, the feasibility of this idea is verified. In the embodiment, the photoresponses can be switched between 6˜8.5 and 7.5˜12 m by the bias polarity and are also tunable by the bias magnitude in each detection wavelength range. In addition, the photoresponses are insensitive to operating temperatures ranging from 20 to 80 K. For the SLIP with few periods, the responsivity may be higher than the one with many periods and the operational temperature is higher. These results show the invention can be useful in the design of multicolor imaging systems.

Abstract: An infrared photodetector structure with voltage-tunable and -switchable photoresponses constructed of superlattices and blocking barriers. The photoresponses of the double-superlattice structure are also insensitive to the operating temperature changes. By using GaAs/AlxGa1-xAs system, the feasibility of this idea is verified. In the embodiment, the photoresponses can be switched between 6˜8.5 and 7.5˜12 m by the bias polarity and are also tunable by the bias magnitude in each detection wavelength range. In addition, the photoresponses are insensitive to operating temperatures ranging from 20 to 80 K. For the SLIP with few periods, the responsivity may be higher than the one with many periods and the operational temperature is higher. These results show the invention can be useful in the design of multicolor imaging systems.