Abstract: An automated testing machine with data processing function and an information processing method thereof are introduced. The automated testing machine includes a test head for testing more than one device under testing (DUT), and the test head further includes a test processing unit for providing more than one electrical test signal to the DUTs and conducting a processing and analyzing on more than one electrical feedback data fed back from the DUTs, so as to generate analysis result information. With the test processing unit capable of conducting data processing directly provided in the test head, signals obtained from the DUTs can be directly analyzed and processed to enable increased data processing efficiency, increased convenience in use and reduced costs of the automated test machine and the information processing method thereof.

Abstract: An automated testing machine with data processing function and an information processing method thereof are introduced. The automated testing machine includes a test head for testing more than one device under testing (DUT), and the test head further includes a test processing unit for providing more than one electrical test signal to the DUTs and conducting a processing and analyzing on more than one electrical feedback data fed back from the DUTs, so as to generate analysis result information. With the test processing unit capable of conducting data processing directly provided in the test head, signals obtained from the DUTs can be directly analyzed and processed to enable increased data processing efficiency, increased convenience in use and reduced costs of the automated test machine and the information processing method thereof.