Abstract: A light-emitting device comprises a substrate; a first light-emitting unit and a second light-emitting unit formed on the substrate, each of the first light-emitting unit and the second light-emitting unit comprises a first semiconductor layer, a second semiconductor layer, and an active layer between the first semiconductor layer and the second semiconductor layer, wherein the first light-emitting unit comprises a first semiconductor mesa and a first surrounding part surrounding the first semiconductor mesa, and the second light-emitting unit comprises a second semiconductor mesa and a second surrounding part surrounding the second semiconductor mesa; a trench formed between the first light-emitting unit and the second light-emitting unit and exposing the substrate; a first insulating layer comprising a first opening on the first surrounding part and a second opening on the second semiconductor layer of the second light-emitting unit; and a connecting electrode comprising a first connecting part on the first

Abstract: A method for instantly determining the mutual geometric positions and orientations between a plurality of 3D motion capture sensors has three or more reference markers mounted fixedly relative to each other on substantially one single plane which are sensed by each sensor. Said method enables said sensors to cooperate as a larger sensing system for 3D motion capture applications without requiring said sensors to be mounted rigidly relative to each other.

Abstract: A method of single photon emission computed tomography (SPECT) using dual-isotopes of [99mTc]TRODAT-1 and [123I]ADAM is provided. Through SPECT, anomalies in dopamine and serotonin system are diagnosed with their photos in one examination. Thus, cost and labor for two examinations are saved and uses of SPECT are reduced.

Abstract: A method of single photon emission computed tomography (SPECT) using dual-isotopes of [99mTc]TRODAT-1 and [123I]ADAM is provided. Through SPECT, anomalies in dopamine and serotonin system are diagnosed with their photos in one examination. Thus, cost and labor for two examinations are saved and uses of SPECT are reduced.

Abstract: A method for depositing, by ion beam sputtering, a multilayer reflective coating of a reflective mask blank for EUV lithography on a substrate having a concave defect formed thereon, characterized in that the method comprises carrying out ion beam sputtering so that an absolute value of an angle ? formed between a normal line of a substrate and sputtered particles landing on the substrate is maintained so as to satisfy the formula of 35°???80° while rotating the substrate about a central axis thereof.

Abstract: A sensor for determining a one-dimensional component of the angular orientation of a radiation source relative to the sensor has a radiation sensitive element which produces an electrical signal representative of radiation incidence upon the element. A radiation-opaque mask is mounted between the element and the radiation source. A first plurality of parallel slit apertures are provided in the mask. The slits are spaced relative to one another, and the element is aligned relative to the mask, such that radiation emitted by the source through at least one of the slits is simultaneously incident upon at least two independent radiation-sensitive points on the element while the source is within an intended operational range of the sensor; and, the points are displaced from the one slit by different distances.