Abstract: A package structure including a semiconductor die, a redistribution circuit structure and an electronic device is provided. The semiconductor die is laterally encapsulated by an insulating encapsulation. The redistribution circuit structure is disposed on the semiconductor die and the insulating encapsulation. The redistribution circuit structure includes a colored dielectric layer, inter-dielectric layers and redistribution conductive layers embedded in the inter-dielectric layers. The electronic device is disposed over the colored dielectric layer and electrically connected to the redistribution circuit structure.

Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected to the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second electrical lines respectively.

Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has two first connecting circuits and two second connecting circuits, wherein an end of each first connecting circuit is connected to the PCB. The probe base is provided between the substrate and the DUT with the probes provided thereon, wherein an end of each probe is exposed and electrically connected to one second connecting circuit, while another end thereof is also exposed to contact the DUT. Each signal path switcher is provided on the probe base, and respectively electrically connected to another end of one first and one second connecting circuits. The capacitor is provided on the probe base with two ends electrically connected to the two signal path switchers.

Abstract: A probe card, which is between a tester and a device under test (DUT), includes two first electrical lines, two second electrical lines, two inductive elements, and a capacitor. The first electrical lines are electrically connected to the probes respectively. The second first electrical lines are electrically connected to the first electrical lines respectively. The inductive elements are electrically connected the first electrical lines and the tester respectively; and the capacitor has opposite ends connected to the second first electrical lines respectively.

Abstract: An acquisition scheme is provided for receiving a Bluetooth basic data rate (BDR) or enhanced data rate (EDR) packet. An acquisition apparatus for a Bluetooth receiver includes: a phase differentiator; a plurality of basic building blocks; a plurality of 1-bit switches; and a correlation computation equation. It features an acquisition circuit implementation with 1-bit correlator hardware shared by access code and EDR synchronization sequence correlation computations.

Abstract: The present invention discloses a method and apparatus to provide, effectively and robustly, a phase reference in phase-domain for digital phase-modulated signals. Not only the first-order but also higher order PLLs are delineated for robust and fast tracking of frequency errors and time-varying frequency errors between the transmitter and the receiver. This invention can be applied to any phase-modulated signal such as PSK, DPSK, ?/4-DPSK, and CPM. The decoders with this invention can achieve close to the performance of coherent detection. Reference [1] D. Divsalar and M. K. Simon, “Multiple-symbols differential detection of MPSK,” IEEE Trans. Commun., vol. 38, pp. 300-308, March 1990. [2] Specification of the Bluetooth System, 2.0+EDR, 4 Nov. 2004.

Abstract: The present invention discloses an effective apparatus and method to measure the received signal quality for a GFSK modulated signal with (or without) an unknown modulation index. The signal quality measurements are based on the decoded (unknown or known) bits and the trellis of the frequency discriminator output. This trellis is pre-calibrated with a reference Rx. The transmitted modulation index is also accurately estimated in this invention.

Abstract: An acquisition scheme for receiving a Bluetooth basic data rate (BDR) or enhanced data rate (EDR) packet. A simplified acquisition apparatus for a Bluetooth receiver having a phase differentiator, a plurality of basic building blocks, a plurality of 1-bit switch, and a correlation computation equation. It features a simplified acquisition circuit implementation with a 1-bit correlator hardware shared by access code and EDR synchronization sequence correlation computations. A 4 MHz sampling rate is used for correlation computation. A SINC interpolator is then used to get an 8 or 16 MHz timing resolution for data bit decoding. Based on the measurement results, this simple acquisition scheme can support successful decoding of a received Bluetooth packet with a maximum timing offset of +/?40 ppm and a maximum frequency offset of +/?60 ppm without loss of receiver sensitivity.

Abstract: The present invention discloses a method and apparatus to provide, effectively and robustly, a phase reference in phase-domain for digital phase-modulated signals. Not only the first-order but also higher order PLLs are delineated for robust and fast tracking of frequency errors and time-varying frequency errors between the transmitter and the receiver. This invention can be applied to any phase-modulated signal such as PSK, DPSK, ?/4-DPSK, and CPM. The decoders with this invention can achieve close to the performance of coherent detection. Reference [1] D. Divsalar and M. K. Simon, “Multiple-symbols differential detection of MPSK,” IEEE Trans. Commun., vol. 38, pp. 300-308, March 1990. [2] Specification of the Bluetooth System, 2.0+EDR, 4 Nov.

Abstract: The present invention discloses an effective apparatus and method to measure the received signal quality for a GFSK modulated signal with (or without) an unknown modulation index. The signal quality measurements are based on the decoded (unknown or known) bits and the trellis of the frequency discriminator output. This trellis is pre-calibrated with a reference Rx. The transmitted modulation index is also accurately estimated in this invention.