Patents by Inventor Hsinjou Lin

Hsinjou Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11747382
    Abstract: Testing equipment is used in an antenna testing process, and includes a testing head having a perforation, and a testing device having a cylinder. The cylinder is disposed in the perforation to act as a cavity for the antenna testing process. Therefore, only the cylinder needs to be replaced when the antenna testing process is performed on different devices under test, with the whole testing head intact.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: September 5, 2023
    Assignee: Siliconware Precision Industries Co., Ltd.
    Inventors: Bo-Siang Fang, Kuang-Sheng Wang, Hsinjou Lin, Shao-Meng Sim, Mao-Hua Yeh
  • Patent number: 11193972
    Abstract: An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: December 7, 2021
    Assignee: Siliconware Precision Industries Co., Ltd.
    Inventors: Bo-Siang Fang, Kuan-Ta Chen, Hsinjou Lin
  • Publication number: 20210123962
    Abstract: Testing equipment is used in an antenna testing process, and includes a testing head having a perforation, and a testing device having a cylinder. The cylinder is disposed in the perforation to act as a cavity for the antenna testing process. Therefore, only the cylinder needs to be replaced when the antenna testing process is performed on different devices under test, with the whole testing head intact.
    Type: Application
    Filed: December 20, 2019
    Publication date: April 29, 2021
    Inventors: Bo-Siang Fang, Kuang-Sheng Wang, Hsinjou Lin, Shao-Meng Sim, Mao-Hua Yeh
  • Publication number: 20210072307
    Abstract: An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.
    Type: Application
    Filed: January 6, 2020
    Publication date: March 11, 2021
    Inventors: Bo-Siang Fang, Kuan-Ta Chen, Hsinjou Lin